Postek, M.
, Keery, W.
and Frederick, N.
(1990),
Low-Profile Microchannel-Plate Electron Detector System for SEM, Proc., 12th International Congress for Electron Microscopy, Seattle, WA, USA
(Accessed May 5, 2025)
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.