TY  - CONF
AU  - Postek, Michael
AU  - Keery, William
AU  - Frederick, Nolan
C2  - Proc.,  12th International Congress for Electron Microscopy, Seattle, WA, USA
DA  - 1990-12-31 00:12:00
LA  - en
PB  - Proc.,  12th International Congress for Electron Microscopy, Seattle, WA, USA
PY  - 1990
TI  - Low-Profile Microchannel-Plate Electron Detector System for SEM
ER  -