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Search Publications

NIST Authors in Bold

Displaying 501 - 525 of 2915

Automated Mechanical Exfoliation of MoS2 and MoTe2 Layers for 2D Materials Applications

September 13, 2019
Author(s)
Albert Davydov, Sergiy Krylyuk, Kyle J. DiCamillo, Makarand Paranjape, Wendy Shi
An automated technique is presented for mechanically exfoliating single-layer and few-layer transition metal dichalcogenides using controlled shear and normal forces imposed by a parallel plate rheometer. A thin sample that is removed from bulk MoS2 or

Simplify your life

December 2, 2020
Author(s)
Gordon Drake, Eite Tiesinga
Within the Hartree atomic unit systems, the Schrödinger equation becomes parameter free. But there's more to it than making a student's life easier, as Gordon Drake and Eite Tiesinga recount.

Basic Metrology for 2020

April 30, 2020
Author(s)
Stephan Schlamminger, Richard Davis
2019 was a big year for Metrology. The international system of units was revised on World Metrology Day, May 20th, that year [1]. What will 2020 bring? In this article we discuss five promising advances that we have on a watchlist for 2020. First, we

Recent measurements of the gravitational constant as a function of time

June 11, 2015
Author(s)
Stephan Schlamminger, Jens H. Gundlach, Riley D. Newman
A recent publication (J.D. Anderson et. Al., EPL 110, 1002) found a strong correlation between the measured values of the gravitational constant G and the 5.9-year oscillation of the length of day. Here, we provide a compilation of all published

A determination of the local acceleration of gravity for the NIST-4 watt balance

January 21, 2015
Author(s)
David B. Newell, Eric J. Leaman, Darine El Haddad, Frank C. Seifert, Leon S. Chao, Yusi A. Cao, Jon R. Pratt, Stephan Schlamminger
A new watt balance is being constructed at the National Institute of Standards and Technology in preparation for the redefinition of the International System of Units and the realization of mass through an exact value of the Planck constant. The total

On-chip synthesis of quasi two-dimensional semimetals from multi-layer chalcogenides

September 23, 2024
Author(s)
Jun Cai, Huairuo Zhang, Yuanqiu Tan, Zheng Sun, Rahul Tripathi, Peng Wu, Sergiy Krylyuk, Caleb Suhy, Jing Kong, Albert Davydov, Zhihong Chen, Joerg Appenzeller
… semiconducting InSe flakes of below 20 nm in thickness with nickel deposited on top, followed by a low-temperature … semimetal via reaction with the laterally diffusing nickel. Atomic resolution spectroscopy reveals the converted …

Crack Propagation Across an Adhesive Interlayer in Flexural Loading

October 8, 2007
Author(s)
James J. Lee, H Chai, Isabel K. Lloyd, Brian R. Lawn
Crack propagation across interlayers separating adjoining brittle plates in flexure is studied using a model glass/epoxy/glass system. A transverse starter crack in the center glass plate is made to propagate to the nearest epoxy interface, where it

A Free-Boundary Model for Duffusion-Induced Grain Boundary Motion

January 1, 2002
Author(s)
P C. Fife, John W. Cahn, C M. Elliott
On the basis of a phase-field model previously proposed in Cahn et al. (acta Mater. 45, 4397-4413 (1997)) to describe the phenomenon of diffusion-induced grain boundary motion (DIGM), we present a formal asymptotic reduction to a moving free boundary

MEMS Nanopositioners

January 1, 2016
Author(s)
Jason J. Gorman
… and size. … Jason J. Gorman … Nanopositioning Technologies: Fundamentals and Applications … MEMS, microelectromechanical …

Size-exclusion chromatography

February 1, 2013
Author(s)
Andre M. Striegel
… Andre M. Striegel … Liquid Chromatography: Fundamentals and Instrumentation … Elsevier, Amsterdam, -1 … …

Standardization of LED Measurements

January 1, 2004
Author(s)
Carl C. Miller, Yoshihiro Ohno
… C. Miller , Yoshihiro Ohno … Photonics and Nanostructures-Fundamentals and Applications … Standardization of LED …
Displaying 501 - 525 of 2915
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