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Displaying 2751 - 2775 of 2915

Characterization of Inertance Tubes Using Resonance Effects

June 14, 2006
Author(s)
Michael A. Lewis, Peter E. Bradley, Ray Radebaugh, Zhihua Gan
Inertance tubes can be characterized by their inertance, compliance, and resistance. All three of these impedance components are present during normal measurements of inertance tube impedance. As a result, in comparing experimental results with models it

Optical Bandgaps and Composition Dependence of Hafnium Aluminate Thin Films grown by Atomic Layer Chemical Vapor Deposition

November 17, 2005
Author(s)
Nhan V. Nguyen, Safak Sayan, Igor Levin, James R. Ehrstein, I.J.R. Baumvol, C. Driemeier, L Wielunski, Pui-Yee Hung, Alain C. Diebold
Hafnium-aluminate (HfAlO) films grown on Si by Atomic Layer Chemical Vapor Deposition (ALCVD) of different aluminum contents were investigated in this article. Vacuum Ultra-Violet Spectroscopic Ellipsometry (VUV-SE), high Resolution Transmission Electron

Exploring and Extending the Limits of CD-SEMs' Resolution

November 1, 2003
Author(s)
Andras Vladar, Michael T. Postek, John S. Villarrubia
This study of SEM resolution is occasioned by concerns that it is no longer adequate for lithography process control in integrated circuit manufacturing. For example, according to the most recent International Technology Roadmap for Semiconductors, the in

ALOFT-PC: A Smoke Plume Trajectory Model for Personal Computers

March 1, 2003
Author(s)
William D. Walton, Kevin B. McGrattan, J V. Mullin
As the understanding of the capabilities and limitations of in situ burning of oil spills increases, in situ burning continues to gain acceptance as an oil spill mitigation tool. One widely imposed criteria for the use of in situ burning is limiting the

Exploring and Extending the Limits of CD-SEMs' Resolution

March 1, 2003
Author(s)
Andras Vladar, Michael T. Postek, John S. Villarrubia
This study of SEM resolution is occasioned by concerns that it is no longer adequate for lithography process control in integrated circuit manufacturing. For example, according to the most recent International Technology Roadmap for Semiconductors, the in

Standards for Reliability Testing of Heavy Vehicle

October 1, 2001
Author(s)
S Jahanmir, James F. Kelly, William E. Luecke
The objective of this project is to develop international standard test methods for assessing the reliability of ceramic components used in diesel engines and other heavy vehicle propulsion systems. Advanced ceramics such as silicon nitrides offer unique

Standards for Reliability Testing of Heavy Vehicle Propulsion Materials

January 1, 2001
Author(s)
S Jahanmir, James F. Kelly, William E. Luecke
The objective of this project is to develop international standard test methods for assessing the reliability of ceramic components used in diesel engines and other heavy vehicle propulsion systems. Advanced ceramics such as silicon nitride offer a unique

Linear Procedures for Structures with Velocity-Dependent Dampers

August 1, 2000
Author(s)
Fahim Sadek, B Mohraz, Michael A. Riley
Passive energy dissipation devices are used to reduce the damaging effects of earthquakes. These devices can absorb a portion of the earthquake-induced energy in structures and thus reduce the energy demand on structural members. Wide acceptance of these

A Policy Perspective on Electronic Commerce

September 1, 1999
Author(s)
E Maxwell, S A. Wakid, J A. Moline
On July 1, 1997, President Clinton issued A Framework for Global Electronic Commerce identifying nine areas in which international agreements would be needed in order to preserve the Internet as a non-regulatory medium.The implementation of global

Intercomparison of SEM, AFM, and Electrical Linewidths

June 1, 1999
Author(s)
John S. Villarrubia, Ronald G. Dixson, Samuel N. Jones, J R. Lowney, Michael T. Postek, Richard A. Allen, Michael W. Cresswell
Uncertainty in the locations of line edges dominates the uncertainty budget for high quality sub-micrometer linewidth measurements. For microscopic techniques like scanning electron microscopy (SEM) and atomic force microscopy (AFM), the image of the sharp

Strategic Plan 2010

April 21, 2010
Author(s)
Gerald T. Fraser
The Optical Technology Division s 2010 Strategic Plan defines the Mission, Vision, and Strategic Elements for the Division. The Strategic Elements consist of Optical Radiation Standards, Optical Measurement Methods, and Optical Measurement Services. The

Skyrmion-Excited Spin-Wave Fractal Networks

August 18, 2023
Author(s)
Nan Tang, W. L. N. C. Liyanage, Sergio A. Montoya, Sheena Patel, Lizabeth J. Quigley, Alexander Grutter, Michael R. Fitzsimmons, Sunil Sinha, Julie A. Borchers, Eric E. Fullerton, Lisa Debeer-Schmitt, Dustin A. Gilbert
Magnetic skyrmions exhibit unique, technologically relevant pseudo-particle behaviors which arise from their topological protection, including well-defined, three-dimensional breathing and gyration modes which occur at microwave frequencies. During dynamic

Near Zero Field Magnetoresistance Spectroscopy: A New Tool in Semiconductor Reliability Physics

May 15, 2023
Author(s)
Patrick Lenahan, Elias Frantz, Sean King, Mark Anders, Stephen Moxim, James P Ashton, Kenneth Myers, Michael Flatte, Nicholas Harmon
A relatively simple addition to many widely utilized semiconductor device characterization techniques can allow one to identify much of the atomic scale structure of point defects which play important roles in the electronic properties of the devices under
Displaying 2751 - 2775 of 2915
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