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Displaying 1026 - 1050 of 1600

The joint automated repository for various integrated simulations (JARVIS) for data-driven materials design

November 12, 2020
Author(s)
Kamal Choudhary, Kevin Garrity, Andrew C. Reid, Brian DeCost, Adam Biacchi, Angela R. Hight Walker, Zachary Trautt, Jason Hattrick-Simpers, Aaron Kusne, Andrea Centrone, Albert Davydov, Francesca Tavazza, Jie Jiang, Ruth Pachter, Gowoon Cheon, Evan Reed, Ankit Agrawal, Xiaofeng Qian, Vinit Sharma, Houlong Zhuang, Sergei Kalinin, Ghanshyam Pilania, Pinar Acar, Subhasish Mandal, David Vanderbilt, Karin Rabe
… and ≈1 million calculated properties in JARVIS-DFT, ≈500 materials and ≈110 force-fields in JARVIS-FF, and ≈25 ML …

Soft X-ray spectroscopy with transition-edge sensors at Stanford Synchrotron Radiation Lightsource beamline 10-1

November 5, 2019
Author(s)
Sang-Jun Lee, Charles Titus, Roberto A. Mori, Michael Baker, Douglas Bennett, Hsiao-Mei Cho, W.Bertrand (Randy) Doriese, Joseph Fowler, Kelly J. Gaffney, Allesandro Gallo, Johnathon Gard, Gene C. Hilton, Hoyoung Jang, Young I. Joe, Christopher Kenney, Jason Knight, Thomas Kroll, Jun-Sik Lee, Dale Li, Donhui Lu, Ronald Marks, Michael Minitti, Kelsey Morgan, Ogasawara Hirohito, Galen O'Neil, Carl D. Reintsema, Dan Schmidt, Dimosthenis Sokaras, Joel Ullom, Tsu-Chien Weng, Christopher Williams, Betty A. Young, Daniel Swetz, Kent D. Irwin, Dennis Nordlund
… pixels combined is 1.5 eV full width at half maximum at 500 eV. We describe the performance of the TES spectrometer …

LEAD-FREE SOLDER DATA: COLLECTION AND DEVELOPMENT

January 10, 2005
Author(s)
Thomas A. Siewert, David R. Smith, Yi-Wen Cheng, Juan C. Madeni, S X. Liu
… subjected to thermal aging tests for 20, 100, 200, and 500 hours at 70, 100, and 150 oC. The results confirm that …
Displaying 1026 - 1050 of 1600
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