Soft X-ray spectroscopy with transition-edge sensors at Stanford Synchrotron Radiation Lightsource beamline 10-1

Published

November 5, 2019

Author(s)

Sang-Jun Lee, Charles Titus, Roberto A. Mori, Michael Baker, Douglas Bennett, Hsiao-Mei Cho, W.Bertrand (Randy) Doriese, Joseph Fowler, Kelly J. Gaffney, Allesandro Gallo, Johnathon Gard, Gene C. Hilton, Hoyoung Jang, Young I. Joe, Christopher Kenney, Jason Knight, Thomas Kroll, Jun-Sik Lee, Dale Li, Donhui Lu, Ronald Marks, Michael Minitti, Kelsey Morgan, Ogasawara Hirohito, Galen O'Neil, Carl D. Reintsema, Dan Schmidt, Dimosthenis Sokaras, Joel Ullom, Tsu-Chien Weng, Christopher Williams, Betty A. Young, Daniel Swetz, Kent D. Irwin, Dennis Nordlund

Abstract

We present results obtained with a new soft X-ray spectrometer based on transition-edge sensors (TESs) composed of Mo/Cu bilayers coupled to bismuth absorbers. This spectrometer simultaneously provides excellent energy resolution, high detection efficiency, and broadband spectral coverage. The new spectrometer is optimized for incident X-ray energies below 2 keV. Each pixel serves as both a highly sensitive calorimeter and an X-ray absorber with near unity quantum efficiency. We have commissioned this 240-pixel TES spectrometer at the Stanford Synchrotron Radiation Lightsource beamline 10-1 (BL 10-1) and used it to probe the local electronic structure of sample materials with unprecedented sensitivity in the soft X-ray regime. As mounted, the TES spectrometer has a maximum detection solid angle of 2 x 10⁻³ sr. The energy resolution of all pixels combined is 1.5 eV full width at half maximum at 500 eV. We describe the performance of the TES spectrometer in terms of its energy resolution and count-rate capability and demonstrate its utility as a high throughput detector for synchrotron-based X-ray spectroscopy. Results from initial X-ray emission spectroscopy and resonant inelastic X-ray scattering experiments obtained with the spectrometer are presented.

Citation

Review of Scientific Instruments

Volume

90

Pub Type

Journals

Download Paper

https://doi.org/10.1063/1.5119155

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Keywords

tes, synchroton, slac, x-ray, spectrometer, xas, xes, rixs, transition edge sensor, incident, pixel, calorimeter, quantum efficiency, Lightsource, beamline, sensitivity

Citation

Lee, S. , Titus, C. , Mori, R. , Baker, M. , Bennett, D. , Cho, H. , Doriese, W. , Fowler, J. , Gaffney, K. , Gallo, A. , Gard, J. , Hilton, G. , Jang, H. , Joe, Y. , Kenney, C. , Knight, J. , Kroll, T. , Lee, J. , Li, D. , Lu, D. , Marks, R. , Minitti, M. , Morgan, K. , Hirohito, O. , O'Neil, G. , Reintsema, C. , Schmidt, D. , Sokaras, D. , Ullom, J. , Weng, T. , Williams, C. , Young, B. , Swetz, D. , Irwin, K. and Nordlund, D. (2019), Soft X-ray spectroscopy with transition-edge sensors at Stanford Synchrotron Radiation Lightsource beamline 10-1, Review of Scientific Instruments, [online], https://doi.org/10.1063/1.5119155, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=927671 (Accessed October 8, 2025)