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NIST Authors in Bold

Displaying 1 - 25 of 2392

MICROMETROLOGY IN PURSUIT OF QUANTUM RADIATION STANDARDS

November 9, 2021
Author(s)
Ryan P. Fitzgerald, Zeeshan Ahmed, Denis E. Bergeron, Nikolai Klimov, Dan Schmidt, Ronald Tosh
With the recent redefinition of the SI base units in terms of constants of nature, the race is on to maximize achievable precision by developing primary standards based on quantum metrology, thereby to realize the Quantum SI. For the becquerel (Bq) and

A Resilient Architecture for the Realization and Distribution of Coordinated Universal Time to Critical Infrastructure Systems in the United States: Methodologies and Recommendations from the National Institute of Standards and Technology (NIST)

November 3, 2021
Author(s)
Jeffrey Sherman, Ladan Arissian, Roger Brown, Matthew J. Deutch, Elizabeth Donley, Vladislav Gerginov, Judah Levine, Glenn Nelson, Andrew Novick, Bijunath Patla, Tom Parker, Benjamin Stuhl, Jian Yao, William Yates, Michael A. Lombardi, Victor Zhang, Douglas Sutton
The Time and Frequency Division of the National Institute of Standards and Technology (NIST), an agency of the United States Department of Commerce (DOC), was tasked with fulfilling Section 4, Part (i) of the Position, Navigation and Timing (PNT) Executive

Electro-optically derived millimeter-wave sources with phase and amplitude control

October 12, 2021
Author(s)
Bryan Bosworth, Nick Jungwirth, Kassi Smith, Jerome Cheron, Franklyn Quinlan, Ari Feldman, Dylan Williams, Nate Orloff, Chris Long
Integrated circuits are building blocks in millimeter-wave handsets and base stations, requiring nonlinear characterization to optimize performance and energy efficiency. Today's sources use digital-to-analog converters to synthesize arbitrary electrical

X-ray Computed Tomography Instrument Performance Evaluation, Part III: Sensitivity to Detector Geometry and Rotation Stage Errors at Different Magnifications

September 29, 2021
Author(s)
Prashanth Jaganmohan, Bala Muralikrishnan, Meghan Shilling, Ed Morse
With steadily increasing use in dimensional metrology applications, especially for delicate parts and those with complex internal features, X-ray computed tomography (XCT) has transitioned from a medical imaging tool to an inspection tool in industrial

Quantum-Based Photonic Sensors for Pressure, Vacuum, and Temperature Measurements: A Vison of the Future with NIST on a Chip

September 17, 2021
Author(s)
Jay H. Hendricks, Zeeshan Ahmed, Daniel Barker, Kevin O. Douglass, Stephen Eckel, James A. Fedchak, Nikolai Klimov, Jacob Edmond Ricker, Julia Scherschligt
The NIST on a Chip (NOAC) program's central idea is the idea that measurement technology can be developed to enable metrology to be performed "outside the National Metrology Institute" by the crea-tion of deployed and often miniaturized standards. These

Metrological Tools for the Reference Materials and Reference Instruments of the NIST Material Measurement Laboratory

September 16, 2021
Author(s)

Carlos R. Beauchamp, Johanna Camara, Jennifer Carney, Steven J. Choquette, Kenneth D. Cole, Paul C. DeRose, David L. Duewer, Michael Epstein, Margaret Kline, Katrice Lippa, Enrico Lucon, John L. Molloy, Michael Nelson, Karen W. Phinney, Maria Polakoski, Antonio Possolo, Lane C. Sander, John E. Schiel, Katherine E. Sharpless, Michael R. Winchester, Donald Windover

The National Institute of Standards and Technology (NIST), formerly the National Bureau of Standards, was established by the U.S. Congress in 1901 and charged with establishing a measurement foundation to facilitate U.S. and international commerce. NIST

Laser-based comparison calibration of laboratory standard microphones

August 30, 2021
Author(s)
Randall Wagner, Richard A. Allen, Qian Dong
A precision laser-based comparison calibration method for laboratory standard microphones is described that uses reference microphones calibrated by the pressure reciprocity method. Electrical drive current and diaphragm velocity are measured while the

Ultraviolet Radiation Technologies and Healthcare Associated Infections: Standards and Metrology Needs

August 20, 2021
Author(s)
Dianne L. Poster, C Cameron Miller, Richard Martinello, Norman Horn, Michael T. Postek, Troy Cowan, Yaw S. Obeng, John J. Kasianowicz
The National Institute of Standards and Technology (NIST) hosted an international workshop on ultraviolet-C (UV-C) disinfection technologies on January 14 – 15, 2020 in Gaithersburg, Maryland in collaboration with the International Ultraviolet Association

Measurement Uncertainty of Surface Temperature Distributions for Laser Powder Bed Fusion Processes

August 10, 2021
Author(s)
David Deisenroth, Sergey Mekhontsev, Brandon Lane, Leonard M. Hanssen, Ivan Zhirnov, Vladimir Khromchenko, Steven Grantham, Daniel Cardenas-Garcia, Alkan Donmez
This paper describes advances in measuring the characteristic spatial distribution of surface temperature and emissivity during laser-metal interaction under conditions relevant for laser powder bed fusion (LPBF) additive manufacturing processes. Detailed

Atom probe tomography

July 22, 2021
Author(s)
Ann Chiaramonti Debay, Baptiste Gault, Julie Cairney, Michael P. Moody, Oana Cojocaru-Miredin, Patrick Stender, Renelle Dubosq, Christoph Freysoldt, Surendra Kumar Makineni, Tong Li
Atom probe tomography (APT) provides three-dimensional compositional mapping with sub-nanometre resolution. The sensitivity of APT is in the range of parts per million for all elements, including light elements such as hydrogen, carbon or lithium, enabling

LIQUID FLOW METER CALIBRATIONS WITH NIST's 15 kg/s WATER FLOW STANDARD

June 15, 2021
Author(s)
Jodie Gail Pope, Aaron Johnson, James Filla, Vern E. Bean, Michael R. Moldover, Joey Boyd, Christopher J. Crowley, Iosif Isaakovich Shinder, Keith A. Gillis, John D. Wright
We describe the 15 kg/s water flow calibration standard operated by the Fluid Metrology Group of the National Institute of Standards and Technology (NIST) to calibrate liquid flow meters for customers. The 15 kg/s standard is a dynamic, gravimetric, liquid

Metrological Traceability Frequently Asked Questions and NIST Policy

May 6, 2021
Author(s)
Sally Bruce, Antonio Possolo, Robert Watters
The NIST policy on metrological traceability (NIST P 5800.00, which became effective on May 31st, 2019) is transcribed and supplemented with a review of relevant terminology and with a list of frequently asked questions and answers. This list updates and

Report of the 104th National Conference on Weights and Measures

May 3, 2021
Author(s)
Yvonne Branden
The 104th Annual Meeting of the National Conference on Weights and Measures (NCWM) was held July 14 - 18, 2019, at the Hyatt Regency Milwaukee Hotel, Milwaukee, Wisconsin. The theme of the meeting was "Assuring Equity in the Marketplace: NIST and NCWM
Displaying 1 - 25 of 2392