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Search Publications

NIST Authors in Bold

Displaying 21251 - 21275 of 73697

Mass diffusion of organic fluids: a molecular dynamics perspective

May 31, 2013
Author(s)
Alexander Y. Smolyanitsky, Andrei F. Kazakov, Thomas J. Bruno, Marcia L. Huber
A well-established interaction potential, the Optimized Potential for Liquid Simulation All-Atom (OPLS-AA) force-field, within the MD framework was used to determine self- and mutual diffusivity of several near-critical and supercritical fluids. The test

Photochemical Properties of Some Cl-Containing Halogenated Alkanes

May 31, 2013
Author(s)
Vladimir L. Orkin, Victor Khamaganov, E. E. Kasimovskaya, A G. Guschin
Rate constants for the gas phase reactions of OH radicals with three partially halogenated alkanes, CHCl3 (kMC), CHFClCFCl2 (k122a), and CH2CFCl2 (k132c), were measured using a discharge flow – electron paramagnetic resonance technique over the temperature

Reliability Monitoring For Highly Leaky Devices

May 31, 2013
Author(s)
Jason T. Ryan, Jason P. Campbell, Kin P. Cheung, John S. Suehle, Richard Southwick, Anthony Oates
We demonstrate a new charge pumping (CP) methodology, frequency modulated CP (FMCP), that robustly treats metrology challenges associated with high gate leakage current. By moving to an AC coupled measurement, we are able to easily resolve small CP signals

Testing quantum expanders is co-QMA-complete

May 31, 2013
Author(s)
Yi-Kai Liu, Stephen P. Jordan, Pawel Wocjan, Adam Bookatz
A quantum expander is a unital quantum channel that is rapidly mixing, has only a few Kraus operators, and can be implemented efficiently on a quantum computer. We consider the problem of estimating the mixing time (i.e., the spectral gap) of a quantum

AlGaAs Composition Standards at NIST

May 30, 2013
Author(s)
Kristine A. Bertness
High-accuracy comparison standards for Al mole fraction x in AlxGa1–xAs have been available at NIST since 2006 via the Standard Reference Material (SRM) program. This extended abstract describes the development history and technology behind these SRMs.

Canonicalization in the PrIKL Reasoner

May 30, 2013
Author(s)
Don E. Libes, Antoine D. Gerardin, Severin Tixier, Fabian M. Neuhaus
Many objects in the PrIKL Reasoner have a canonical representation. This representation and its implementation required a number of choices with ramifications. This paper describes the choices, their consequences, and some of the more interesting

Sensitivity of gold nano conductors to common contaminations ab initio results

May 29, 2013
Author(s)
Shmuel Barzilai, Francesca M. Tavazza, Lyle E. Levine
Gold nanowire chains are considered a good candidate for nanoelectronic devices because they exhibit remarkable structural and electrical properties. A previous study shows that the beryllium terminated BeO (0001) surface may be a useful platform for

Thermal Decomposition Kinetics of 1,3,5-Triisopropylcyclohexane

May 29, 2013
Author(s)
Raina V. Gough, Jason A. Widegren, Thomas J. Bruno
Recent surrogate diesel fuel mixture development identified the need for a multiply-substituted, low cetane number, high molecular mass monocycloalkane component. On the basis of a thermophysical property evaluation and prediction, 1,3,5

Continuum-based free vibration of circular trigonal and isotropic plates

May 28, 2013
Author(s)
Ward L. Johnson, Paul R. Heyliger
The free vibration behavior of completely unrestrained elastic circular plates with trig- onal and isotropic material symmetry is studied using approximate solutions to the three- dimensional theory of linear elasticity. Of primary interest are 1) the

Practical Strategies for QKD Key Production

May 28, 2013
Author(s)
Alan Mink, Anastase Nakassis
We present the quantum key distribution (QKD) secure key ratio expression in a form that exposes the parameters that affect the Reconciliation (error correction) stage. Reconciliation is the least well understood in practical terms and is typically

Use of RF-Based Technique as a Metrology Tool for TSV Reliability Analysis

May 28, 2013
Author(s)
Chukwudi A. Okoro, Yaw S. Obeng, Jan Obrzut, Pavel Kabos, Klaus Hummler
In this work, we used radio frequency (RF) based measurement technique is used as a prognostic tool for the assessment of the effect of thermal cycling on the reliability of through-silicon via (TSV) stacked dies. It was found that RF signal integrity in

X-Ray Micro-Beam Diffraction Determination of Full Stress Tensors in Cu TSVs

May 28, 2013
Author(s)
Chukwudi A. Okoro, Lyle E. Levine, Oleg A. Kirillov, Yaw S. Obeng, Ruqing Xu, Jonathan Z. Tischler, Wenjun Liu, Klaus Hummler
We report the first non-destructive, depth resolved determination of the full stress tensor in Cu through-silicon vias (TSVs), using synchrotron based micro-beam X-ray diffraction. Two adjacent Cu TSVs were studied; one deliberately capped with SiO2, the
Displaying 21251 - 21275 of 73697
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