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Search Publications

NIST Authors in Bold

Displaying 10401 - 10425 of 73697

Optimization of Reflectometry Experiments using Information Theory

February 1, 2019
Author(s)
Bradley W. Treece, Paul A. Kienzle, David Hoogerheide, Charles Majkrzak, Mathias Loesche, Frank Heinrich
A method based on Bayesian statistics and information theory is developed to analyze the information gain Δ}H of surface-sensitive reflectometry experiments. After presenting the underlying mathematical framework and its implementation, the method is

Propagating Measurement Uncertainty to Microwave Amplifier Nonlinear Behavioral Models

February 1, 2019
Author(s)
Dylan F. Williams, Laurence T. Stant, Martin J. Salter, Nick M. Ridler, Peter Aaen
We propagate for the first time correlated measurement uncertainties into a nonlinear behavioral model of a millimetre-wave amplifier. We make use of the NIST Microwave Uncertainty Framework to evaluate the uncertainties in large-signal electromagnetic

Structural and Dynamical Order of a Disordered Protein: Molecular Insights into Conformational Switching of PAGE4 at the Systems Level

February 1, 2019
Author(s)
Xingcheng Ling, Prakash Kulkarni, Federico Bocci, Nicholas Schafer, Susmita Roy, Min-Yeh Tsai, Yanan He, Yihong Chen, Krithika Rajagopalan, Steven Mooney, Yu Zeng, Keith Weninger, Alexander Grishaev, Jose Onuchic, Herbert Levine, Peter Wolynes, Govindan Rangarajan, Vladimir Uversky, John Orban, Mohit Jolly
Folded proteins show a high degree of structural order and undergo (fairly constrained) collective motions related to their functions. On the other hand, intrinsically disordered proteins (IDPs), while lacking a well-defined three-dimensional structure, do

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February 1, 2019
Author(s)
Scott Rose, J Stephen Nightingale, Simson Garfinkel, Ramaswamy Chandramouli

X-ray Metrology for the Semiconductor Industry Tutorial

February 1, 2019
Author(s)
Daniel F. Sunday, Wen-Li Wu, Scott Barton, Regis J. Kline
The semiconductor industry is in need of new, in-line dimensional metrology methods with higher spatial resolution for characterizing their next generation nanodevices. The purpose of this short course is to train the semiconductor industry on the NIST

Dynamics of Hydride Ions in Metal Hydride-Reduced BaTiO 3 Samples Investigated with Quasielastic Neutron Scattering

January 31, 2019
Author(s)
Carin Eklof-Osterberg, Reji Nedumkandathil, Ulrich Haussermann, Aleksander Jaworski, Andrew J. Pell, Madhu Sudan Tyagi, Niina H. Jalarvo, Bernhard Frick, Antonio Faraone, Maths Karlsson
Perovskite-type oxyhydrides, BaTiO 3-xH^ x, have been recently shown to exhibit hydride ion (H -) conductivity at elevated temperatures, but the underlying mechanism of hydride ion conduction and how it depends on temperature and oxygen vacancy

Parallel Self-Testing of the GHZ State with a Proof by Diagrams

January 31, 2019
Author(s)
Spencer J. Breiner, Amir Kalev, Carl Miller
Quantum self-testing addresses the following question: is it possible to verify the existence of a multipartite state even when one's measurement devices are completely untrusted? This problem has seen abundant activity in the last few years, particularly

Progress and Challenges in Ocean Metaproteomics and Proposed Best Practices for Data Sharing

January 31, 2019
Author(s)
Mak Saito, Erin Bertrand, Megan Duffy, David Gaylord, Noelle Held, Judson Harvey, Robert Hettich, Pratik Jagtap, Michael G. Janech, Danie Kinkade, Dasha Leary, Matt McIlvin, Eli Moore, Robert Morris, Ben Neely, Brook Nunn, Jaclyn Sanders, Adam Shepherd, Nick Symmonds, David Walsh
Ocean metaproteomics is an emerging field that provides an exciting new datatype with potential to enable discoveries regarding marine microbial communities and their underlying impact on global biogeochemical processes. For example, recent ocean

Report of the Pilot study CCQM-P188 (in parallel with CCQM-K120.a and b)

January 31, 2019
Author(s)
Christopher W. Meyer, Flores Edgar, Viallon Joele, Tiphaine Choteau, Philippe Moussay, Faraz Idrees, Robert Wielgosz, Daniel Rzesanke
The Pilot Study CCQM-P188 was conducted in parallel of the Key Comparisons CCQM-K120.a and CCQM-K120.b, which were designed to evaluate the level of compatibility of participants capabilities for value assigning carbon dioxide in air reference gas mixtures

Status Report on the First Round of the NIST Post-Quantum Cryptography Standardization Process

January 31, 2019
Author(s)
Gorjan Alagic, Jacob M. Alperin-Sheriff, Daniel Apon, David Cooper, Quynh H. Dang, Carl Miller, Dustin Moody, Rene Peralta, Ray Perlner, Angela Robinson, Daniel Smith-Tone, Yi-Kai Liu
The National Institute of Standards and Technology is in the process of selecting one or more public-key cryptographic algorithms through a public competition-like process. The new public- key cryptography standards will specify one or more additional

First observation with global network of optical atomic clocks aimed for a dark matter detection

January 30, 2019
Author(s)
P. Wcislo, P. Ablewski, Kyle Beloy, S. Bilicki, M. Bober, Roger Brown, Robert J. Fasano, R. Ciurylo, H. Hachisu, T. Ido, J. Lodewyck, Andrew Ludlow, Will McGrew, P. Morzynski, Daniele Nicolodi, Marco Schioppo, M. Sekido, R. Le Targat, P. Wolf, Xiaogang Zhang, B. Zjawin, M. Zawada
We report on the first earth-scale quantum sensor network based on optical atomic clocks aimed at dark matter (DM) detection. Exploiting differences in the susceptibilities to the fine- structure constant of essential parts of an optical atomic clock, i.e

Understanding Material Characteristics through Signature Traits from He Pycnometry

January 30, 2019
Author(s)
Huong Giang T. Nguyen, Jarod C. Horn, Matthew Bleakney, Daniel W. Siderius, Laura Espinal
Although helium pycnometry is generally the method of choice for skeletal density measurements of porous materials, few studies have provided a wide range of case studies that demonstrate how to best interpret raw data and perform measurements using it

Annual Manufacturing Review: 2018

January 28, 2019
Author(s)
Douglas Thomas
This annual report characterizes US innovation and industrial competitiveness in manufacturing. It includes tracking domestic manufacturing activity and its domestic supply chain in order to develop a quantitative depiction of US manufacturing in the
Displaying 10401 - 10425 of 73697
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