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Selected Area Electron Beam Induced Deposition of Pt and W for Electron Back Scattered Diffraction Backgrounds

Published

Author(s)

William Alexander Osborn, Mark McLean, Brian G. Bush

Abstract

Applying High Resolution Electron Backscatter Diffraction (HR-EBSD) to materials without regions amenable to acquiring backgrounds for static flat fielding (background subtraction) can cause analysis problems. To address this difficulty, the efficacy of Electron Beam Induced Deposition (EBID) material as a source for an amorphous background signal is assessed and found to be practical. Using EBID material for EBSD backgrounds allows single crystal and large grained samples to be analyzed using HR-EBSD for strain and small angle rotation measurement.
Citation
Microscopy and Microanalysis

Keywords

EBSD, EBID, HR-EBSD, Background, Band Contrast

Citation

Osborn, W. , McLean, M. and Bush, B. (2019), Selected Area Electron Beam Induced Deposition of Pt and W for Electron Back Scattered Diffraction Backgrounds, Microscopy and Microanalysis, [online], https://doi.org/10.1017/S1431927618016173 (Accessed June 12, 2024)

Issues

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Created February 1, 2019, Updated March 7, 2023