TY  - JOUR
AU  - Osborn, William
AU  - McLean, Mark
AU  - Bush, Brian
C2  - Microscopy and Microanalysis
DA  - 2019-02-01 05:02:00
DO  - https://doi.org/10.1017/S1431927618016173
LA  - en
PB  - Microscopy and Microanalysis
PY  - 2019
TI  - Selected Area Electron Beam Induced Deposition of Pt and W for Electron Back Scattered Diffraction Backgrounds
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=926224
ER  -