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NIST Authors in Bold

Displaying 32176 - 32200 of 74303

Guide for the Selection of Chemical, Biological, Radiological, and Nuclear Decontamination Equipment for First Responders

March 1, 2007
Author(s)
Alim A. Fatah, Richard Arcilesi, Adam Judd, Laurel O'Connor, Charlotte H. Lattin, Corrie Y. Wells
The primary purpose of the Guide for the Selection of Chemical, Biological, Radiological, and Nuclear (CBRN) Decontamination Equipment for Emergency First Responders is to provide emergency first responders with information to aid them in the selection of

Multiscale Model of Germanium Quantum Dots in Silicon

March 1, 2007
Author(s)
David T. Read, Vinod Tewary
Atomic displacements, strains and strain energies in the neighborhood of near-spherical, coherent germanium ¿quantum dots¿ (QD) in crystalline silicon and near a 001} Si surface have been predicted by multiscale modeling, using a combination of classical

Nonparametric Inference for Balanced Randomization Designs

March 1, 2007
Author(s)
Andrew L. Rukhin
The properties of two balanced randomization schemes which allocate the known number of subjects among several treatments are compared. According to the first procedure, the so-called truncated multinomial randomization design, the allocation process

Organic Electronics: Low Power, High Impact

March 1, 2007
Author(s)
David J. Gundlach
Reducing the operating voltage and power consumption of organic-based logic circuits for portable applications is a critical step towards organic electronics becoming a commercial technology.

Precise Alignment of single Nanowires and Fabrication of Nanoelectromechanical Switch and Other Test Structures

March 1, 2007
Author(s)
Qiliang Li, Sang-Mo Koo, Curt A. Richter, Monica D. Edelstein, John E. Bonevich, Joseph Kopanski, John S. Suehle, Eric M. Vogel
The integration of nanowires and nanotubes into electrical test structures to investigate their nanoelectronic transport properties is a significant challenge. Here we present a single nanowire manipulating system to precisely manipulate and align

Process Monitoring of Turning and Model Adaptation for Smart Machining Systems

March 1, 2007
Author(s)
Jarred C. Heigel, Robert W. Ivester
Smart Machining Systems improve manufacturing efficiency using optimization based on process models. Cutting force models developed from a narrow set of empirical data provide insight into the physical properties of cutting, but the extreme physical

The Architecture Development Facilitator (ADF) First Year Report

March 1, 2007
Author(s)
Steven J. Fenves, Eswaran Subrahmanian, Puja Goyal, Jean-Cyrus L. Angbo, Faouzi Daoud, Ram D. Sriram
This document serves as the summary report on the first year?s progress on the Architecture Development Facilitator (ADF) project covering the activities from December 15, 2005, to December 15, 2006. The ADF is intended to assist the Office of Network

The Coming of Age of Tilt CD-SEM

March 1, 2007
Author(s)
B Bunday, J Allgair, E Solecky, C Archie, Ndubuisi George Orji
The need for 3D metrology is becoming more urgent to address critical gaps in metrology for both lithographic and etch processes. Current generation lithographic processing (ArF source, where lambda=193 nm) sometimes results in photoresist lines with re

The Stiffness of Collagen Fibrils Influences Vascular Smooth Muscle Cell Phenotype

March 1, 2007
Author(s)
Dennis P. McDaniel, Gordon A. Shaw, John T. Elliott, Kiran Bhadriraju, Curtis W. Meuse, Koo-Hyun Chung, Anne L. Plant
Cells receive signals from the extracellular matrix through receptor-dependent interactions, but they are also influenced by the mechanical properties of the matrix. While bulk properties of substrates have been shown to effect cell behavior, we show here

Vehicle Fire Suppression Research Needs

March 1, 2007
Author(s)
Anthony P. Hamins
This report identifies research needs in automotive fire protection. The work focuses on the problem of post-collision vehicle fires. Recent fire suppression research is cited with special attention given to results cited in the scientific literature as

Verification and Validation--How to Determine the Accuracy of Fire Models.

March 1, 2007
Author(s)
Mark H. Salley, Jason Dreisbach, Kendra Hill, Bijan Najafi, Francisco Joglar, Anthony Hamins, Kevin B. McGrattan, Richard Peacock, Robert Kassawara
Both domestically and worldwide, there is a movement to introduce risk-informed and performance-based analyses into fire protection engineering practice. One key tool needed to support risk-informed, performance-based (RI/PB) fire protection is fire models

Zero-Order Imaging of Device-Sized Overlay Targets Using Scatterfield Microscopy

March 1, 2007
Author(s)
Bryan M. Barnes, Lowell P. Howard, P Lipscomb, Richard M. Silver
Patterns of lines and trenches with nominal linewidths of 50 nm have been proposed for use as an overlay target appropriate for placement inside the patterned wafer die. The NIST Scatterfield Targets feature groupings of eight lines and/or trenches which
Displaying 32176 - 32200 of 74303