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Metrology

Electrical / electromagnetic metrology

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Displaying 1 - 25 of 458

Kelvin probe force microscopy under ambient conditions

August 21, 2025
Author(s)
Amirhossein Zahmatkeshsaredorahi, Ruben Millan-Solsona, Devon Jakob, Liam Collins, Xiaoji Xu
Kelvin Probe Force Microscopy (KPFM), a technique derived from Atomic Force Microscopy (AFM), provides nanometer-scale spatial resolution for mapping surface potential or work function differences across material systems. It serves as a powerful tool for

Implementation of a 1 GO star-mesh graphene quantum Hall array resistance standard network for high resistance calibration

July 3, 2025
Author(s)
Dean Jarrett, Albert Rigosi, Yanfei Yang, Alireza Panna, David Newell, Ngoc Thanh Mai Tran, Wei-Chen Lin, Marta Musso, Cheng-Hsueh Yang, Chi-Te Liang, Massimo Ortolano, Randolph Elmquist
A 1 GΩ star-mesh quantized Hall array resistance standard (QHARS) made of thirty-seven quantum Hall effect (QHE) elements was fabricated and tested. The 1 GΩ QHARS has three orders of magnitude fewer QHE elements than a largely series 1 GΩ QHARS, which

Elucidating the thermal properties and anomalous transport in the 18R polytype of SnSe2

May 30, 2025
Author(s)
Oluwagbemiga Ojo, Wilarachchige D. C. B. Gunatilleke, Winnie Wong-Ng, Tieyan Chang, Yu-Sheng Chen, Joshua Martin, Adam Biacchi, George Nolas
The 18R polytype of SnSe2 possesses unique structural features that can directly impact the transport properties and potential applications of interest; however, a comprehensive understanding of the intrinsic physical properties is lacking. We grew large

Measuring Out-of-Plane Permittivity of Thin Films to Millimeter Wave Frequencies

April 22, 2025
Author(s)
Florian Bergmann, Meagan Papac, Benjamin Jamroz, Nicholas Jungwirth, Bryan Bosworth, Anna Osella, Tomasz Karpisz, Lucas Enright, Eric Marksz, Angela Stelson, Christian Long, Nathan Orloff, Robert Jones
Modern microchips utilize multilayer stack-ups with many interstitial layers of dielectrics. Optimizing device performance and maximizing yield requires precise measurements of the out-of-plane permittivity of these dielectric layers. At the same time

Application of Voltage Controlled Crystal Oscillators to DC Voltage Reference Validation

April 8, 2025
Author(s)
Matthew Spidell, Malcolm White, Alan Jaffe, John Lehman, Gaylon Partain
DC voltage references are typically based on calibrated Zener Diodes which are subject to drift and therefore require periodic recalibration against a Primary Standard. Since it is preferable to maintain constant power to such references, the shipping and

Dual-Frequency-Bias Programmable Josephson Voltage Standard Circuit

March 14, 2025
Author(s)
Alain Rufenacht, Anna Fox, Raegan Johnson, Benjamin Scheck, Paul Dresselhaus, Samuel Benz
This article presents a 2-V programmable Josephson voltage standard (PJVS) with dual microwave frequency inputs and multiple output taps. The design provides three main features: 1) output voltages with nanovolt resolution; 2) the ability to perform a

Leakage Current Pathways in Josephson Arbitrary Waveform Synthesizer Standards

February 26, 2025
Author(s)
Raegan Johnson, Jesus Mejia, Alain Rufenacht, Anna Fox, Nathan Flowers-Jacobs, Frederic Overney, Paul Dresselhaus, Samuel Benz
The voltage errors related to ac leakage currents in Josephson arbitrary waveform synthesizer (JAWS) systems are significant contributors to the overall system accuracy. These ac leakage currents flow through paths (typically to ground) that are not part

Glass microwave microfluidic devices for broadband characterization of diverse fluids

November 15, 2024
Author(s)
Jacob Pawlik, Tomasz Karpisz, Yasaman Kazemipour, Nicholas Derimow, Sarah Evans, Bryan Bosworth, Christian Long, Nathan Orloff, James Booth, Angela Stelson
We demonstrate a glass microwave microfluidic device for determining the permittivity of a wide range of liquid chemicals from 100 MHz to 10 GHz with relatively low uncertainty. Conventional microwave microfluidic devices use polymer-based microfluidic

Compact Homodyne Extrapolation System (CHEXS)

October 27, 2024
Author(s)
Joshua Gordon, Benjamin Moser
We present on a novel gain extrapolation antenna range, the Compact Homodyne Extrapolation System (CHEXS), that can achieve absolute antenna gain measurements with uncertainties of 0.1 dB or better with as few at 10 data points and is significantly more

VHF Josephson Arbitrary Waveform Synthesizer

October 1, 2024
Author(s)
Jeremy Thomas, Nathan Flowers-Jacobs, Anna Fox, Akim Babenko, Samuel Benz, Paul Dresselhaus
We report on the design, fabrication, and measurement of a Very High Frequency band Josephson Arbitrary Waveform Synthesizer (VHF-JAWS) at frequencies up to 50.05 MHz. The VHF-JAWS chip is composed of a series array of 12810 Josephson junctions (JJs)

On Digital Signal Processing of Time Series for Spectrum Estimation

September 11, 2024
Author(s)
Dazhen Gu, Jake Rezac, Xifeng Lu, Dan Kuester
We present a study of power spectral density (PSD) estimation from data sampled in the time domain. This work was motivated by our recent development of digital radiometry, where radiation spectra were obtained by processing the digitally sampled signal

Statistical study and parallelization of multiplexed single-electron sources

September 9, 2024
Author(s)
S Norimoto, P See, N Schoinas, I Rungger, Tommy Boykin, Michael Stewart, J. P. Griffiths, C. Chen, D. A. Ritchie, M. Kataoka
Increasing electric current from a single-electron source is a main challenge in an effort to establish the standard of the ampere defined by the fixed value of the elementary charge e and operation frequency f . While the current scales with f , due to an

Using Commercial Source Measure Units for Traceable RF Power Measurements

September 4, 2024
Author(s)
Cole Gray, Aaron Hagerstrom, Zenn Roberts, Christian Long
Abstract—As a National Metrology Institute (NMI), the National Institute of Standards and Technology (NIST) maintains traceable measurement capabilities for a variety of quantities, including microwave power. At NMIs and calibration laboratories, traceable

Differential Measurements of an AC Source with a Josephson Arbitrary Waveform Synthesizer

August 30, 2024
Author(s)
Alain Rufenacht, Raegan Johnson, Anna Fox, Nathan Flowers-Jacobs, Charlie Burroughs, Samuel Benz, Paul Dresselhaus, STEPHANE SOLVE, Jesus Mejia
This paper describes differential sampling measurements of an ac source and a Josephson arbitrary waveform synthesizer (JAWS). A new iterative approach for aligning the phases of the JAWS and the source waveforms was implemented to minimize the
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