NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Metrology

Search Publications

Search Title, Abstract, Conference, Citation, Keyword or Author
  • Published Date
Displaying 576 - 600 of 2714

LTE impacts on GPS

February 15, 2017
Author(s)
William F. Young, Ari D. Feldman, Sheryl M. Genco, Azizollah Kord, Daniel G. Kuester, John M. Ladbury, Duncan A. McGillivray, Audrey K. Puls, Andre R. Rosete, Adam J. Wunderlich, Wen-Bin Yang
This report describes the test methodology from “LTE impacts on GPS: Test and Metrology Plan” developed by National Advanced Spectrum and Communications Test Network (NASCTN), and data that are the result of executing the test method. The fundamental goals

Noise characteristics of thermistors: measurement methods and results of selected devices

February 13, 2017
Author(s)
Ivan Ryger, Michelle S. Stephens, Malcolm G. White, Nathan A. Tomlin, Matthew T. Spidell, John H. Lehman, Dave Harber
As part of the development of a spectrally-uniform room-temperature absolute radiometer, we have studied the electrical noise of several bulk chip thermistors in order to estimate the noise floor and optical dynamic range. Understanding the fundamental

Enabling photoemission electron microscopy in liquids via graphene-capped microchannel arrays

February 8, 2017
Author(s)
Hongxuan Guo, Evgheni Strelcov, Alexander Yulaev, Jian Wang, Narayana Appathurai, Stephen Urquhart, John Vinson, Subin Sahu, Michael P. Zwolak, Andrei Kolmakov
Photoelectron emission microscopy (PEEM) is a powerful tool to spectroscopically access dynamic surface processes at the nanoscale but is traditionally limited to ultra-high or moderate vacuum conditions. Here, we develop a novel graphene-capped

Final report on the key comparison, CCM.PK15 in the pressure rangefrom 1.0 x 10-4 Pa to 1.0 Pa

January 30, 2017
Author(s)
Christian Wuethrich, Hitoshi Akimichi, Mercede Bergoglio, James A. Fedchak, Karl Jousten, Sueng Soo Hong, Jorge T. Guzman
The comparison CCM.M.P-K14 is a key comparison in pressure involving six laboratories in three regional metrological organizations (RMO). The measurand of the comparison is the accommodation coefficient of two spinning rotating gauge characterized in

From Image Tiles to Web-Based Interactive Measurements in One Stop

January 4, 2017
Author(s)
Antoine Vandecreme, Michael P. Majurski, Joe Chalfoun, Keana Scott, John Henry Scott, Mary C. Brady, Peter Bajcsy
This article aims at introducing readers to a web-based solution useful for interactive measurements of centimeter-sized specimens at nanoscales. Modern imaging technology has enabled nanoscale imaging to become a routine process. As the imaging technology

Gas-phase broadband spectroscopy using active sources: progress, status, and applications

January 1, 2017
Author(s)
Kevin C. Cossel, Eleanor M. Waxman, Ian A. Finneran, Geoffery A. Blake, Jun Ye, Nathan R. Newbury
Broadband spectroscopy is an invaluable tool for measuring multiple gas-phase species simultaneously. In this work we review current applications for broad-band spectroscopy. We discuss components of broad-band spectroscopy including light sources

Automation of Piston Gauge Calibration Services Phase I Results

December 29, 2016
Author(s)
Katie M. Schlatter, Julia Scherschligt, John S. Quintavalle, Robert G. Driver, Christina D. Cross
This report documents efforts to date to automate Piston Gage Calibration Services. This report includes an overview of the project, results for Phase I Implementation efforts, and a look ahead to Phase II. Phase I Measures and Deliverables are based on

Spectral dependence of carrier lifetimes in silicon for photovoltaic applications

December 21, 2016
Author(s)
John F. Roller, Yu-Tai Li, Mario Dagenais, Behrang H. Hamadani
Charge carrier lifetimes in photovoltaic-grade silicon wafers were measured by a spectral-dependent, quasi-steady-state photoconductance technique. Narrow bandwidth LEDs were used to excite excess charge carriers within the material, and the effective

Certification of New Standard Reference Material 2806b Medium Test Dust in Hydraulic Oil

December 19, 2016
Author(s)
Robert A. Fletcher, Nicholas W. Ritchie, David S. Bright, James J. Filliben, William F. Guthrie
A new material has been certified to become Standard Reference Material (SRM) 2806b - Medium Test Dust in Hydraulic Fluid. SRM 2806b consists of a trace polydisperse, irregularly shaped mineral dust particles suspended in hydraulic fluid. The certified

Introduction to the special issue on small-angle scattering

December 19, 2016
Author(s)
Michael Gradzielski, Andrew J. Allen
This is the foreword for a Special Issue of the Journal of Applied Crystallography on Small-Angle Scattering. This special issue collects together full-length peer-reviewed research papers in association with the 15th International Conference on Small

NIST Handbook 105-4: Specifications and Tolerances for Reference Standards and Field Standard Weights and Measures, Specifications and Tolerances for Liquefied Petroleum Gas and Anhydrous Ammonia Liquid Volumetric Provers (2016 Ed.)

December 13, 2016
Author(s)
Georgia L. Harris, Val R. Miller
These specifications and tolerances are recommended as minimum requirements for standards used by state and local weights and measures officials and others in the regulatory verification of meters used in quantity determination of pressurized liquid

Vector-Network-Analyzer Calibration Using Line and Multiple Coplanar-Waveguide Offset Reflects

December 9, 2016
Author(s)
Arkadiusz C. Lewandowski, Wojciech Wiatr, Dazhen Gu, Nate Orloff, Thomas Mitchell (Mitch) Wallis, Pavel Kabos
We present the application of our newly developed multi-reflect-thru technique to vector-network-analyzer calibration in the on-wafer environment. This technique uses a set of highly-reflective one-port devices, referred to as offset-reflects, and a single

Draft B Report on the Key Comparison CCM.P-K4.2012 in Absolute Pressure from 1 Pa to 10 kPa

December 7, 2016
Author(s)
Jacob E. Ricker, Jay H. Hendricks, Thomas Bock, Prazak Dominik, Tokihiko Kobata, Jorge Torres, Irina Sadkovskaya
This report summarizes the Consultative Committee for Mass (CCM) key comparison CCM.P-K4.2012 for absolute pressure spanning the range of 1 Pa to 10 000 Pa. The comparison was completed via calibration of a transfer standard carried out at six NMIs during

NIST Handbook 133: Checking the Net Contents of Packaged Goods (2017 Ed.)

December 6, 2016
Author(s)
Lisa Warfield, David Sefcik, Linda D. Crown
This handbook has been prepared as a procedural guide for the compliance testing of net contents statements on packaged goods. Compliance testing of packaged goods is the determination of the conformance results of the packaging, distribution, and

Electron Microscopy and Nanoscopy: Analytical

December 5, 2016
Author(s)
Vladimir P. Oleshko
The analytical electron microscope (AEM) is a transmission and/or scanning transmission electron microscope (S/TEM) which is modified to permit composition analyses using x-ray energy-dispersive spectroscopy (XEDS) and/or electron energy-loss spectroscopy
Was this page helpful?