Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Noise characteristics of thermistors: measurement methods and results of selected devices

Published

Author(s)

Ivan Ryger, Michelle S. Stephens, Malcolm G. White, Nathan A. Tomlin, Matthew T. Spidell, John H. Lehman, Dave Harber

Abstract

As part of the development of a spectrally-uniform room-temperature absolute radiometer, we have studied the electrical noise of several bulk chip thermistors in order to estimate the noise floor and optical dynamic range. Understanding the fundamental limits of the temperature sensitivity leads inevitably to studying the noise background of the complex electro-thermal system. To this end, we employ a measurement technique based on alternating-current synchronous demodulation. Results of our analysis show that the combination of a low-current noise Junction Field Effect Transistor (JFET) preamplifier, together with chip thermistors is optimal for our purpose, yielding a root mean square noise temperature of 2.8 µK in the frequency range of 0.01 Hz to 1 Hz.
Citation
Review of Scientific Instruments
Volume
88

Keywords

Resistance noise, 1/f noise, white noise, synchronous demodulation, fast Fourier transform

Citation

Ryger, I. , Stephens, M. , White, M. , Tomlin, N. , Spidell, M. , Lehman, J. and Harber, D. (2017), Noise characteristics of thermistors: measurement methods and results of selected devices, Review of Scientific Instruments, [online], https://doi.org/10.1063/1.4976029 (Accessed May 18, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created February 13, 2017, Updated November 10, 2018