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Noise characteristics of thermistors: measurement methods and results of selected devices



Ivan Ryger, Michelle S. Stephens, Malcolm G. White, Nathan A. Tomlin, Matthew T. Spidell, John H. Lehman, Dave Harber


As part of the development of a spectrally-uniform room-temperature absolute radiometer, we have studied the electrical noise of several bulk chip thermistors in order to estimate the noise floor and optical dynamic range. Understanding the fundamental limits of the temperature sensitivity leads inevitably to studying the noise background of the complex electro-thermal system. To this end, we employ a measurement technique based on alternating-current synchronous demodulation. Results of our analysis show that the combination of a low-current noise Junction Field Effect Transistor (JFET) preamplifier, together with chip thermistors is optimal for our purpose, yielding a root mean square noise temperature of 2.8 µK in the frequency range of 0.01 Hz to 1 Hz.
Review of Scientific Instruments


Resistance noise, 1/f noise, white noise, synchronous demodulation, fast Fourier transform


Ryger, I. , Stephens, M. , White, M. , Tomlin, N. , Spidell, M. , Lehman, J. and Harber, D. (2017), Noise characteristics of thermistors: measurement methods and results of selected devices, Review of Scientific Instruments, [online], (Accessed May 18, 2024)


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Created February 13, 2017, Updated November 10, 2018