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Metrology

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Displaying 351 - 375 of 2714

Ohms Law Low-current Calibration System for Ionization Chambers

August 24, 2020
Author(s)
Dean G. Jarrett, Shamith U. Payagala, Ryan P. Fitzgerald, Denis E. Bergeron, Jeffrey T. Cessna, Charles J. Waduwarage Perera, Neil M. Zimmerman
A system for the calibration of electrometers that measure currents from ionization chambers is described. The calibration system uses a 1 GΩ standard resistor in series with a stable voltage source to generate calibration currents from 1 pA to 20 nA

The Design of an Instrument to Realize Small Torque at NIST

August 22, 2020
Author(s)
Leon S. Chao, Rafael Marangoni, Frank C. Seifert, Darine El Haddad, Jon R. Pratt, David B. Newell, Stephan Schlamminger
After the recent redefinition of the International System of Units (SI), torque no longer needs to be traceable to a calibrated mass in a gravitational field suspended from a known lever arm and disseminated through a chain of torque transducers.An SI

A Toolbox for Isophase-Curvature Guided Computation of Metrology Holograms

August 13, 2020
Author(s)
Ulf Griesmann, Johannes A. Soons, Gufran S. Khan
We describe the algorithmic foundations of an open-source numerical toolbox, written in the Octave language, for the creation of computer-generated binary and multi-level holograms used in interferometric form error measurements of complex aspheric and

Development of a Kinematic Measurement Method for Knee Exoskeleton Fit to a User

August 4, 2020
Author(s)
Roger V. Bostelman, YaShian Li-Baboud, Karl Van Wyk, Mili Shah
Exoskeletons are now being marketed by several manufacturers and yet there are currently no defined methods to measure the exoskeleton fit to the user. Proper exoskeleton fit to user impacts the safety of the human robot interaction. In this paper, we

Performance evaluation of laser trackers using the network method

July 30, 2020
Author(s)
Ling Wang, Balasubramanian Muralikrishnan, Octavio Icasio Hernandez, Craig M. Shakarji, Daniel S. Sawyer
Due to their accuracy, portability, and large working volume, laser trackers (LTs) are widely used for dimensional metrology in a variety of large-scale manufacturing and assembly operations. Their performance evaluation is a key concern for users

Metrological Tools for the Reference Materials and Reference Instruments of the NIST Material Measurement Laboratory

July 15, 2020
Author(s)
Carlos R. Beauchamp, Johanna Camara, Jennifer Carney, Steven J. Choquette, Kenneth D. Cole, Paul C. DeRose, David L. Duewer, Michael Epstein, Margaret C. Kline, Katrice Lippa, Enrico Lucon, Karen W. Phinney, Maria Polakoski, Antonio Possolo, Katherine E. Sharpless, John R. Sieber, Blaza Toman, Michael R. Winchester, Donald Windover
The National Institute of Standards and Technology (NIST), formerly the National Bureau of Standards, was established by the U.S. Congress in 1901 and charged with establishing a measurement foundation to facilitate U.S. and international commerce. NIST

Charpy Instrumented Test Suite and User's Manual

July 9, 2020
Author(s)
Damian Lauria, Enrico Lucon, Felipe Baldner
The NIST Instrumented Charpy Test Suite is a set of standalone programs intended to allow anyone with appropriate hardware to perform and analyze instrumented Charpy impact tests. The software is provided in both raw code and executable formats with an

Operational Measurement Uncertainty and Bayesian Probability Distribution

June 25, 2020
Author(s)
Raghu N. Kacker
The JCGM documents have undermined the operational concept of uncertainty in measurement established by the GUM and restored the pre-GUM practice of stating possible error relative to the true value, supposedly to align with Bayesian interpretation. It is

CERTIFICATION OF SRM 640f LINE POSITION AND LINE SHAPE STANDARD FOR POWDER DIFFRACTION

May 31, 2020
Author(s)
David R. Black, Marcus Mendenhall, Albert Henins, James Filliben, James Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to be used to evaluate specific aspects of instrument performance of both X-ray and neutron powder diffractometers. This report describes SRM

Improvised Long Test Lengths via Stitching Scale Bar Method: Performance Evaluation of Terrestrial Laser Scanners per ASTM E3125-17

May 28, 2020
Author(s)
Shendong Shi, Balasubramanian Muralikrishnan, Vincent Lee, Daniel S. Sawyer, Octavio Icasio-Hern?ndez
Periodic performance evaluation is a critical issue for ensuring the reliability of data from terrestrial laser scanners (TLSs). With the recent introduction of the ASTM E3125-17 standard, there now exist standardized test procedures for this purpose

Dual Josephson impedance bridge: towards a universal bridge for impedance metrology

May 19, 2020
Author(s)
Frederic Overney, Nathan Flowers-Jacobs, Blaise Jeanneret, Alain Rufenacht, Anna Fox, Paul Dresselhaus, Samuel Benz
This paper presents a full characterization of a Dual Josephson Impedance Bridge (DJIB) at frequencies up to 80kHz by using the DJIB to compare the best available impedance standards that are (a) directly traceable to the quantum Hall effect, (b) used as

Basic Metrology for 2020

April 30, 2020
Author(s)
Stephan Schlamminger, Richard Davis
2019 was a big year for Metrology. The international system of units was revised on World Metrology Day, May 20th, that year [1]. What will 2020 bring? In this article we discuss five promising advances that we have on a watchlist for 2020. First, we

Single-Photon Sources: Approaching the Ideal through Multiplexing

April 30, 2020
Author(s)
Alan L. Migdall, Evan Meyer-Scott, Christine Silberhorn
We review the rapid recent progress in single-photon sources based on multiplexing multiple probabilistic photon-creation events. Such multiplexing allows higher single-photon probabilities and lower contamination from higher-order photon states. We study

Preface: Uncertainty Evaluation by Monte Carlo Method

March 16, 2020
Author(s)
Prem Rachakonda, Vishal Ramnath, Vinay Shankar Pandey
Measurement uncertainty is a parameter that is used to characterize the dispersion of the values attributed to a measurand. There are multiple definitions of measurement uncertainty that were adopted by various international working groups. The differences

Field Ion Emission in an Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet Light

March 12, 2020
Author(s)
Ann C. Chiaramonti Debay, Luis Miaja Avila, Benjamin W. Caplins, Paul T. Blanchard, Norman A. Sanford, Brian Gorman, David R. Diercks
This paper reports construction of an extreme ultraviolet (EUV) radiation-triggered atom probe tomograph and describes the results from initial experiments on amorphous SiO2. Femtosecond-pulsed coherent EUV radiation of 29.6 nm wavelength (41.85 eV photon
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