CERTIFICATION OF SRM 640f LINE POSITION AND LINE SHAPE STANDARD FOR POWDER DIFFRACTION

Published

May 31, 2020

Author(s)

David R. Black, Marcus Mendenhall, Albert Henins, James Filliben, James Cline

Abstract

The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to be used to evaluate specific aspects of instrument performance of both X-ray and neutron powder diffractometers. This report describes SRM 640f, the seventh generation of this powder diffraction SRM, which is designed to be used primarily for calibrating powder diffractometers with respect to line position and line shape for the determination of the Instrument Profile Function (IPF). It is certified with respect to lattice parameter and consists of approximately 7.5 g of silicon powder prepared to minimize line broadening. A NIST built diffractometer, incorporating many advanced design features, was used to certify the lattice parameter of the Si powder. Both Type A, statistical, and Type B, systematic, uncertainties have been assigned to yield a certified value for the lattice parameter at 22.5 °C of a = 0.543 114 4 nm  0.000 008 nm

Citation

Powder Diffraction

Pub Type

Journals

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https://doi.org/10.1017/S0885715620000366

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Keywords

certification, diffractometer, lattice parameter, standard reference material, X-ray diffraction

Citation

Black, D. , Mendenhall, M. , Henins, A. , Filliben, J. and Cline, J. (2020), CERTIFICATION OF SRM 640f LINE POSITION AND LINE SHAPE STANDARD FOR POWDER DIFFRACTION, Powder Diffraction, [online], https://doi.org/10.1017/S0885715620000366, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=929658 (Accessed April 23, 2024)