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A control chart with dynamic control limit is proposed for promoting the developing process of an uncertainty budget, and verifying the developed measurement uncertainty. The up and low dynamic control limit, 2 sd, is calculated from the updated mean,
There is a growing need for the nation to be better prepared to deal with both man-made and natural disasters. The responses to the attacks on the World Trade Center and Hurricane Katrina are strong evidence of this need. Effective emergency response
The lack of global harmonization of RoHS initiatives has been a major headache for the electronics industry, to say the least. A number of organizations have been working very diligently to move standards closer together, with the hope that at some point
Yung-Tsun T. Lee, Swee K. Leong, Frank H. Riddick, Marcus Johansson, Bjoern J. Johansson
Interoperability between manufacturing software applications and simulation is currently extremely limited, and it has been recognized that there is a great need for methods to improve interoperability. The Core Manufacturing Simulation Data (CMSD)
Marcus Johansson, Swee K. Leong, Yung-Tsun T. Lee, Frank H. Riddick, Guodong Shao, Bjoern J. Johansson, Anders Skoogh, P Klingstam
This paper describes an effort of testing the Core Manufacturing Simulation Data (CMSD) information model as a neutral data interface for a discrete event simulation model developed using Enterprise Dynamics. The implementation is based upon a model of a
Large engineering projects have become the norm with new additional requirements arising from the point of view of life cycle management of the product. Traditional methods for generating requirements and concept generation often have not taken into
Mechanical assemblies are systems composed of modules that are either subassemblies or parts. Traditionally an assembly information model contains information regarding parts, their relationships, and its form. But it is important that the model also
Junhwan Kim, Mike Pratt, Raj G. Iyer, Ram D. Sriram
Modern CAD systems generate feature-based product shape models with parameterization and constraints. Until recently, standards for CAD data exchange among different CAD systems were restricted to the exchange of pure shape information. These standards
Sanjay Jain, Frank H. Riddick, Andreas Craens, Deogratias Kibira
The need for interoperability of information systems among supply chain partners has been recognized. A number of standards have been or are being developed to ensure interoperability of applications used along the sup-ply chain. An associated need for
Computer simulation is effective in improving the effi-ciency of manufacturing system design, operation, and maintenance. Most simulation models are usually tailored to address a narrow set of industrial issues, e.g., the intro-duction of a new product. If
Nenad Ivezic, Boonserm Kulvatunyou, Marko Vujasinovic, Pat Snack, Zuran Marjanovic, Hyunbo Cho
We describe a novel semantics-based architecture for standards-based approaches to interoperable applications. The paper includes our experiences in prototyping the proposed architecture and demonstrating the resulting semantic middleware capability. This
Simulation and gaming can support decision making through all phases of incident management including prevention, preparedness, response, recovery and mitigation. A number of gaming and simulation tools have been developed for the purpose but they
Jeong Buhwan, Hyunbo Cho, Boonserm Kulvatunyou, Albert W. Jones
With its prevalence in enterprise applications integration, the service-oriented approach has been studied in various ways. The popularity, however, results in a number of different standards and implementations. The approach needs agreed-upon definitions
Richard M. Silver, Bryan M. Barnes, Ravikiran Attota, Jay S. Jun, Michael T. Stocker, Egon Marx, Heather J. Patrick
We have developed a set of techniques, referred to as scatterfield microscopy, in which the illumination is engineered in combination with appropriately designed metrology targets. Previously we reported results from samples with sub-50 nm sized features
This paper presents a summary and analysis of a study on optical modeling for critical dimension metrology. The paper is focused on two primary elements: 1) the comparison, stability, and validity of multiple electromagnetic scattering models and 2) a
Shaw C. Feng, Theodore V. Vorburger, Che B. Joung, Li Ma
As integrated circuits become smaller and faster, the measurement of line width must have less uncertainty and more versatility. The common requirement for uncertainty is less than 10 nanometers. The industrial need for versatility is three dimensional
The Global Positioning System (GPS) can deliver an exceptionally accurate frequency standard to any point in the world. When we use the GPS signal to control an optical frequency comb, the comb+GPS system provides laser light with well-known frequencies
Jean-Louis Vigouroux, Sebti Foufou, Laurent Deshayes, James J. Filliben, Lawrence A. Welsch, Alkan Donmez
In this paper, a methodology for tuning the design of an evolutionary algorithm (EA) is presented. An EA for solving machining optimization probfems having highly non-linear constraints and uncertainties is studied. A conventional turning optimization
Charles R. McLean, Sanjay Jain, Frank H. Riddick, Yung-Tsun T. Lee
Manufacturing systems are often costly to develop and operate. Simulation technology has been demonstrated to be an effective tool for improving the efficiency of manufacturing system design, operation, and maintenance. But manufacturing simulations are
Charles R. McLean, Sanjay Jain, Andreas Craens, Deogratias Kibira
Studies have documented the high cost of the lack of software interoperability on manufacturing. New interface standards are being developed by various organizations to address interoperability issues. Unfortunately these standards often overlap and
Gas-filled capacitors are being used as primary thermometers and they show promise as primary pressure standards and for measuring the Boltzmann constant. With these metrological applications in mind, we discuss the advantages and disadvantages of audio
Theodore V. Vorburger, James H. Yen, B Bachrach, Thomas Brian Renegar, Li Ma, Hyug-Gyo Rhee, Xiaoyu Alan Zheng, Jun-Feng Song, Charles D. Foreman
This document reports on a study to determine the feasibility and utility of a national ballistics database of casing and bullet images. The purpose of such a proposed database would be to provide a reference collection of ballistic images against which
Simulation is defined as the imitation of the operation of a system or real-world process over time, and in many cases, manufacturing provides one of the most important applications of simulation (Zolfaghari and Roa, 2006). Standard interfaces could make
Since the advent of critical-dimension atomic force microscopes (CD-AFMs) inthe 90s, these tools have enjoyed growing acceptance in semiconductormanufacturing both for process development and to support in-line criticaldimension (CD) metrology. The most
Many semiconductor metrologists are aware that the contribution of line edge roughness (LER), and thus linewidth variation (LWV), can be a significant contributor to measurement uncertainty budget. More generally, the impact of measurand variation and