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Energy

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Displaying 526 - 550 of 571

Synthesis and Single-Crystal X-Ray Diffraction Studies of New Framework Substituted Type II Clathrates, Cs 8 Na 16 Ag x Ge 136-x (x 7)

April 13, 2007
Author(s)
Matthew Beekman, Winnie Wong-Ng, James A. Kaduk, Alexander J. Shapiro, George S. Nolas
New inorganic type II clathrates with Ag atoms substituting for framework Ge atoms, Cs8Na16AgxGe136-x (x = 0, 5.9, and 6.7), have been synthesized by reaction of the pure elements at high temperature. Structural refinements have been performed using single

A High-Throughput Thermoelectric Power-Factor Screening Tool for Rapid Construction of Thermoelectric Property Diagrams

January 23, 2007
Author(s)
Makoto Otani, Nathan Lowhorn, Peter K. Schenck, Winnie K. Wong-Ng, Martin L. Green, K Itaka, H Koinuma
We have developed a high throughput screening tool that maps out thermoelectric power factors of combinatorial composition-spread film libraries. The screening tool allows us to measure the electrical conductivity and Seebeck coefficient of over 1000

Combined NMR and XAS Study on Local Environments and Electronic Structures of the Electrochemically Li-Ion Deintercalated Li1-xCo1/3Ni1/3Mn1/302 Electrode System

January 1, 2004
Author(s)
W S. Yoon, C P. Grey, Mahalingam Balasubramanian, Xiao-Qing Yang, Daniel A. Fischer, James McBreen
Combined 6Li MAS NMR, in-situ metal K-edge (hard) XAS, and O K-edge (soft) XAS have been carried out during the first charging process for the layered Li1-xCo1/3Ni1/3Mn1/3O2 cathode material. The 6Li MAS NMR results showed the prescence of Li in the Ni2+

Compact Photoconductive-based Sampling System with Electronic Sampling Delay

May 1, 2000
Author(s)
W. L. Cao, M. Du, C G. Lee, Nicholas Paulter
As electronic signals move to higher frequencies and wider bandwidths, there is need for new methods of measuring these bandwidths, there is need for new methods of measuring these high frequency/high speed (tens of Hgz and or high bit rate (tens of GBs

Improved Time-Base for Waveform Parameter Estimation

May 1, 2000
Author(s)
Bryan C. Waltrip, Owen B. Laug, Gerard N. Stenbakken
An improved gated-oscillator time-base and associated auto-calibration algorithm for use in a high-accuracy sampling waveform acquistion system are described. The time-base architecture consists of a stable 100 MHz gated-oscillator, 24-bit counter chain

Nonrandom Quantization Errors in Timebases

May 1, 2000
Author(s)
Gerard N. Stenbakken, D. Liu, J. A. Starzyk, Bryan C. Waltrip
Timebase distortion causes nonlinear distortion of waveforms measured by sampling instruments. When such instruments are used to measure the rms amplitude of the sampled waveforms, such distortions result in errors in the measured rms values. This paper

A Wide Bandwidth Printed Wiring Board Transmission Line Probe

March 1, 1999
Author(s)
Nicholas Paulter, Jon R. Pratt
An inexpensive, wide bandwidth, high cycle 50 ω probe is described for making electrical contact to printed wiring board planar transmission lines. The electrical transfer function of the probe and its contact repeatability are presented.

A Pulse Measurement Intercomparison

October 1, 1998
Author(s)
T. M. Souders, J R. Andrews, A. Caravone, J. P. Deyst, C. Duff, S. Naboicheck
A pulse measurement intercomparison, organized by (NIST) and conducted by the authors in their respective labs, is described. The purpose was to assess the state of the art for time-domain pulse-waveform measurements in the nanosecond regime, and to find

Time-Base Nonlinearity Determination Using Iterated Sine-Fit Analysis

October 1, 1998
Author(s)
Gerard N. Stenbakken, J. P. Deyst
A new method is presented to determine the time-base errors of sampling instruments. The method does not require a model for the time-base error and, thus, provides accurate estimates where model-based methods fail. Measurements of sinewaves at multiple

Time-Base Nonlinearity Determination Using Iterated Sine-Fit Analysis

June 1, 1998
Author(s)
Gerard N. Stenbakken, J. P. Deyst
A new method is presented to determine the time-base errors of sampling instruments. The method does not require a model for the time-base error and, thus, provides accurate estimates where model-based methods fail. Measurements of sinewaves at multiple

A Fast Pulse Oscilloscope Calibration System

May 1, 1998
Author(s)
J. P. Deyst, Nicholas Paulter, T. Daboczi, Gerard N. Stenbakken, T. M. Souders
A system is described for calibrating high-bandwidth oscilloscopes using pulse signals. The fast pulse oscilloscope calibration system (FPOCS) is to be used to determine the step response parameters for digitizing oscilloscopes having bandwidths of 20 GHz

A Fast Pulse Oscilloscope Calibration System

May 1, 1998
Author(s)
J. P. Deyst, Nicholas Paulter, T. Daboczi, Gerard N. Stenbakken, T. M. Souders
A system is described for calibrating high-bandwidth oscilloscopes using pulse signals. The fast pulse oscilloscope calibration system (FPOCS) is to be used to determine the step response parameters for digitizing oscilloscopes having bandwidths of 20 GHz

A Pulse Measurement Intercomparison

May 1, 1998
Author(s)
T. M. Souders, J R. Andrews, A. Caravone, J. P. Deyst, C. Duff, S. Naboicheck
A pulse measurement intercomparison, organized by (NIST) and conducted by the authors in their respective labs, is described. The purpose was to assess the state of the art for time-domain pulse-waveform measurements in the nanosecond regime, and to find

Code Probability Distributions of A/D Converters with Random Input Noise

May 1, 1998
Author(s)
T. M. Souders
The specific architecture of an A/D converter influences the code probability distributions that result from random input noise. In particular, the ouput codes of successive approximation A/D converters have a spiked distribution, and its variance is half

Code Probability Distributions of A/D Converters with Random Input Noise

May 1, 1998
Author(s)
T. M. Souders
The specific architecture of an A/D converter influences the code probability distributions that result from random input noise. In particular, the ouput codes of successive approximation A/D converters have a spiked distribution, and its variance is half
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