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  • Published Date
Displaying 301 - 325 of 389

Importance of Display Metrology in a Competitive World

April 26, 2005
Author(s)
Edward F. Kelley
How do contrast, brightness, viewing angle, and other parameters affect the quality of a display? Do the specifications always tell you what you want to know? Is specsmanship a problem? Why is a solid bedrock of display metrology important for the highly

What Do the Specifications Mean?

October 1, 2004
Author(s)
Edward F. Kelley
Specifications and "specsmanship" continue to confuse people despite the fact that a solid metrological basis exists for communicating display performance. We review some of the misunderstandings encountered in the display industry and encourage uniformity

Luminance probes for contrast measurements in medical displays

May 1, 2003
Author(s)
Aldo Badano, Scott Pappada, Edward F. Kelley, Michael J. Flynn, Sandrine Martin, Jerzy Kanicki
We report on a comparative study that examines four conic luminance probes in their ability to measure small-spot display contrast. We performed linear scans of a slit using a computer-controlled stage. We found that, although the probes were assembled

Current Projects in Display Metrology at the NIST Flat Panel Display Laboratory

February 1, 2003
Author(s)
Paul A. Boynton, Edward F. Kelley, John M. Libert
The NIST Flat Panel Display Laboratory (FPDL) is operated through the Display Metrology Project (DMP) of the Electronic Information Technology Group in the Electricity Division of the Electronics and Electrical Engineering Laboratory of NIST. The DMP works

Calibrating Photoreceiver Response to 110 GHz

November 13, 2002
Author(s)
Tracy S. Clement, Dylan F. Williams, Paul D. Hale, Juanita M. Morgan
We have measured the magnitude and phase responses of a photoreceiver to 110 GHz using a calibrated electro-optic sampling system. The frequency range of the calibration is limited only by our 1 mm coaxial connectors.

Sensitivity of Display Reflection Measurements to Apparatus Geometry

May 21, 2002
Author(s)
Edward F. Kelley
Reflection measurements made upon electronic displays can suffer from non-reproducibility owing to their possible strong dependence upon apparatus geometry. The geometrical dependence arises from non-Lambertian diffusion properties. We show the

Fundamentals of Display Metrology

May 19, 2002
Author(s)
Edward F. Kelley
Display metrology is discussed as applied to electronic displays and especially flat panel displays (FPDs). Topics include the importance of proper set up, expected measurement uncertainty vs. repeatability, and problems in making accurate light
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