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How do contrast, brightness, viewing angle, and other parameters affect the quality of a display? Do the specifications always tell you what you want to know? Is specsmanship a problem? Why is a solid bedrock of display metrology important for the highly
When characterizing or calibrating electronic projection display systems, the technical staff needs to understand the capabilities and limitations of the measuring instrumentation used and the procedures implemented. Once these parameters are established
Specifications and "specsmanship" continue to confuse people despite the fact that a solid metrological basis exists for communicating display performance. We review some of the misunderstandings encountered in the display industry and encourage uniformity
We developed high-precision metrology for fiber-amplifier noise figure based on application of a relative intensity noise (RIN) standard to the RIN subtraction method. Calibration of a RIN/noise figure measurement system using the standard yields a typical
Several diffuse-reflectance measurement methods are provided to help characterize the reflection properties of electronic displays. The ambient contrast for any desired illuminance is obtained by scaling the measurement results. Discussions are included on
Aldo Badano, Scott Pappada, Edward F. Kelley, Michael J. Flynn, Sandrine Martin, Jerzy Kanicki
We report on a comparative study that examines four conic luminance probes in their ability to measure small-spot display contrast. We performed linear scans of a slit using a computer-controlled stage. We found that, although the probes were assembled
Quantifying the luminance range in a medical x-ray and the electronic displays for use in radiology is difficult because of the extremely high contrasts involved. Methods are presented here that permit the evaluation of the performance of a detector probe
John M. Libert, Edward F. Kelley, Paul A. Boynton, Steven W. Brown, Christine Wall, Colin Campbell
In earlier papers, NIST proposed a standard illumination source and optical filter targets with which to assess the state-of-the-art of display measurement. The Display Measurement Assessment Transfer Standard (DMATS) was designed to present the display
The NIST Flat Panel Display Laboratory (FPDL) is operated through the Display Metrology Project (DMP) of the Electronic Information Technology Group in the Electricity Division of the Electronics and Electrical Engineering Laboratory of NIST. The DMP works
Tracy S. Clement, Dylan F. Williams, Paul D. Hale, Juanita M. Morgan
We have measured the magnitude and phase responses of a photoreceiver to 110 GHz using a calibrated electro-optic sampling system. The frequency range of the calibration is limited only by our 1 mm coaxial connectors.
Reflection measurements made upon electronic displays can suffer from non-reproducibility owing to their possible strong dependence upon apparatus geometry. The geometrical dependence arises from non-Lambertian diffusion properties. We show the
Display metrology is discussed as applied to electronic displays and especially flat panel displays (FPDs). Topics include the importance of proper set up, expected measurement uncertainty vs. repeatability, and problems in making accurate light
The simulated-eye-design (SED) camera is an attempt to use the technology inherent in the human eye to enable light measurements of complicated objects and virtual images with fewer effects from veiling glare. The interior of a CCD (charge coupled device)