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Sensitivity of Display Reflection Measurements to Apparatus Geometry

Published

Author(s)

Edward F. Kelley

Abstract

Reflection measurements made upon electronic displays can suffer from non-reproducibility owing to their possible strong dependence upon apparatus geometry. The geometrical dependence arises from non-Lambertian diffusion properties. We show the inadequacies of several conventional reflection measurement methods and offer some guidance on how these methods might be improved or replaced.
Citation
Society for Int'l Symposium Digest of Technical Papers
Volume
33
Issue
1
Publisher Info
, Boston, MA

Keywords

diffuse reflecture, display reflection, experimental design, luminance factor, reflectance, reflection measurement

Citation

Kelley, E. (2002), Sensitivity of Display Reflection Measurements to Apparatus Geometry, , Boston, MA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33088 (Accessed April 17, 2024)
Created May 21, 2002, Updated January 27, 2020