Kelley, E.
(2002),
Sensitivity of Display Reflection Measurements to Apparatus Geometry, , Boston, MA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33088
(Accessed May 9, 2025)
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Sensitivity of Display Reflection Measurements to Apparatus Geometry
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Author(s)
Abstract
Reflection measurements made upon electronic displays can suffer from non-reproducibility owing to their possible strong dependence upon apparatus geometry. The geometrical dependence arises from non-Lambertian diffusion properties. We show the inadequacies of several conventional reflection measurement methods and offer some guidance on how these methods might be improved or replaced.Citation
Society for Int'l Symposium Digest of Technical Papers
Volume
33
Issue
1
Publisher Info
, Boston, MA
Pub Type
Books
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Keywords
diffuse reflecture, display reflection, experimental design, luminance factor, reflectance, reflection measurement
Citation
Issues
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Created May 21, 2002, Updated January 27, 2020