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Sensitivity of Display Reflection Measurements to Apparatus Geometry
Published
Author(s)
Edward F. Kelley
Abstract
Reflection measurements made upon electronic displays can suffer from non-reproducibility owing to their possible strong dependence upon apparatus geometry. The geometrical dependence arises from non-Lambertian diffusion properties. We show the inadequacies of several conventional reflection measurement methods and offer some guidance on how these methods might be improved or replaced.
Citation
Society for Int'l Symposium Digest of Technical Papers
Kelley, E.
(2002),
Sensitivity of Display Reflection Measurements to Apparatus Geometry, , Boston, MA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=33088
(Accessed June 6, 2023)