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Electronics

Electromagnetics

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Displaying 1201 - 1225 of 1580

On-Wafer Impedance Measurement on Lossy Substrates

June 1, 1994
Author(s)
Dylan F. Williams, Roger Marks
This paper introduces a new method for measuring impedance parameters in transmission lines fabricated on lossy or dispersive dielectrics. The method, which uses an independent calibration to provide an impedance reference, compares well with conventional

LRM Probe-Tip Calibrations with Imperfect Resistors and Lossy Lines

December 1, 1993
Author(s)
Dylan F. Williams, Roger Marks
The line-reflect-match calibration is extended, without significant loss of measurement accuracy, to accommodate imperfect match standards and lossy lines typical of monolithic microwave integrated circuits. We characterize the match and line standards

Verification of Commercial Probe-Tip Calibrations

December 1, 1993
Author(s)
Roger Marks, Dylan F. Williams
We present results of a verification procedure useful in evaluating the accuracy of probe-tip scattering parameter measurements. The procedure was applied to calibrations and measurements performed in industrial laboratories. Actual measurement
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