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Open-Ended Coaxial Probes for Nondestructive Testing of Substrates and Circuit Boards

Published

Author(s)

James R. Baker-Jarvis, Michael D. Janezic
Proceedings Title
Proc., Mater. Res. Soc. Symp.
Conference Dates
April 4-8, 1994
Conference Location
San Francisco, CA

Citation

Baker-Jarvis, J. and Janezic, M. (1994), Open-Ended Coaxial Probes for Nondestructive Testing of Substrates and Circuit Boards, Proc., Mater. Res. Soc. Symp. , San Francisco, CA (Accessed April 21, 2024)
Created March 31, 1994, Updated October 12, 2021