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Chemistry

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Displaying 1001 - 1025 of 1924

Effects of Materials Chemistry and Morphology on Conductometric Sensor Signals

February 1, 2004
Author(s)
Douglas C. Meier, Stephen Semancik
Observation of conductance changes in material films upon their interactions with gas phase molecules is the basis of operation of the chemical microsensors being developed in the Chemical Sciences and Technology Laboratory at NIST. These interactions are

Progress in the Development of Combustion Databases for Liquid Fuels

January 21, 2004
Author(s)
Wing Tsang
This paper describes the present situation regarding chemical kinetic databases for the simulation of the combustion of liquid fuels. Past work in the area is summarized. Much is known about the, reactions of the smaller fragments from combustion process

Comparative Thickness Measurements of SiO 2 /Si Films for Thickness Less than 10 nm

January 1, 2004
Author(s)
Terrence J. Jach, Joseph A. Dura, Nhan V. Nguyen, J R. Swider, G Cappello, Curt A. Richter
We report on a comparative measurement of SiO 2/Si dielectric film thickness (t < 10 nm) using grazing incidence x-ray photoelectron spectroscopy, neutron reflectometry, and spectroscopic ellipsometry. Samples with nominal thicknesses of 3 nm to 6 nm were
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