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Novel Charge Pumping Method Applied to Tri-Gate MOSFETs for Reliability Characterization

Published

Author(s)

Brad Bittel, S Novak, Steve Ramey, S Padiyar, Jason Ryan, Jason Campbell, Kin P. Cheung
Proceedings Title
2015 IEEE International Integrated Reliability Workshop Final Report
Conference Dates
October 11-15, 2015
Conference Location
South Lake Tahoe, CA, US
Conference Title
2015 IEEE International Integrated Reliability Workshop

Citation

Bittel, B. , Novak, S. , Ramey, S. , Padiyar, S. , Ryan, J. , Campbell, J. and Cheung, K. (2016), Novel Charge Pumping Method Applied to Tri-Gate MOSFETs for Reliability Characterization, 2015 IEEE International Integrated Reliability Workshop Final Report, South Lake Tahoe, CA, US (Accessed July 3, 2022)
Created January 13, 2016, Updated October 12, 2021