TY  - CONF
AU  - Brad Bittel
AU  - S Novak
AU  - Steve Ramey
AU  - S Padiyar
AU  - Jason Ryan
AU  - Jason Campbell
AU  - Kin Cheung
C2  - 2015 IEEE International Integrated Reliability Workshop Final Report, South Lake Tahoe, CA, US
DA  - 2016-01-14 00:01:00
LA  - en
PB  - 2015 IEEE International Integrated Reliability Workshop Final Report, South Lake Tahoe, CA, US
PY  - 2016
TI  - Novel Charge Pumping Method Applied to Tri-Gate MOSFETs for Reliability Characterization
ER  -