@conference{807796,
  author = {Brad Bittel and S Novak and Steve Ramey and S Padiyar and Jason Ryan and Jason Campbell and Kin Cheung},
  title = {Novel Charge Pumping Method Applied to Tri-Gate MOSFETs for Reliability Characterization},
  year = {2016},
  month = {2016-01-14 00:01:00},
  publisher = {2015 IEEE International Integrated Reliability Workshop Final Report, South Lake Tahoe, CA, US},
  language = {en},
}