Chbili, J.
, Chbili, Z.
, Matsuda, A.
, Cheung, K.
, Ryan, J.
, Campbell, J.
and Lahbabi, M.
(2018),
Influence of Lucky Defect Distributions on Early TDDB Failures in SiC Power MOSFETs, 2017 IEEE International Integrated Reliability Workshop Final Report, South Lake Tahoe, CA, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=924689
(Accessed April 25, 2024)
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Influence of Lucky Defect Distributions on Early TDDB Failures in SiC Power MOSFETs
Published
Author(s)
, , , , , , M Lahbabi
Proceedings Title
2017 IEEE International Integrated Reliability Workshop Final Report
Conference Dates
October 8-12, 2017
Conference Location
South Lake Tahoe, CA, US
Conference Title
2017 IEEE International Integrated Reliability Workshop
Pub Type
Conferences
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Citation
Created January 31, 2018, Updated April 19, 2022