@conference{876941,
  author = {Jaafar Chbili and Zakariae Chbili and Asahiko Matsuda and Kin Cheung and Jason Ryan and Jason Campbell and M Lahbabi},
  title = {Influence of Lucky Defect Distributions on Early TDDB Failures in SiC Power MOSFETs},
  year = {2018},
  month = {2018-01-31 05:01:00},
  publisher = {2017 IEEE International Integrated Reliability Workshop Final Report, South Lake Tahoe, CA, US},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=924689},
  language = {en},
}