Skip to main content

NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

A High Dynamic Range Imaging Method for the Characterization of Periodic Errors in Diffraction Gratings

Published

Author(s)

Sofia C. Corzo Garcia, Muhammad I. Afzal, Benjamin Kidder, michelle Grigas, Ulf Griesmann

Abstract

We report on recent progress in the development of our focal plane imaging system for the detection and characterization of small fabrication errors in diffraction gratings. The instrument uses a purpose-designed high dynamic range imaging method in conjunction with a low-cost digital camera to acquire images with a dynamic range that can now exceed eight orders of magnitude. The sensitivity and utility of the instrument is demonstrated with measurements of three different diffraction gratings. Avenues for further possible improvements of the instrument are discussed.
Proceedings Title
Reflection, Scattering, and Diffraction from Surfaces VI
Conference Dates
August 19-23, 2018
Conference Location
San Diego, CA, US

Keywords

Diffraction gratings, High dynamic range imaging, Fabrication errors

Citation

Corzo Garcia, S. , Afzal, M. , Kidder, B. , Grigas, M. and Griesmann, U. (2018), A High Dynamic Range Imaging Method for the Characterization of Periodic Errors in Diffraction Gratings, Reflection, Scattering, and Diffraction from Surfaces VI, San Diego, CA, US, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=926310 (Accessed October 9, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created September 4, 2018, Updated September 29, 2025
Was this page helpful?