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NIST Pubs

Cavity Coupling in Vertical-Cavity Semiconductor Lasers

January 1, 1997

Author(s)

D. T. Schaafsma, David H. Christensen

Relative Permittivity Measurement of Square Copper-Laminated Substrates Using the Full Sheet Resonance Technique

January 1, 1997

Author(s)

R L. Lewis

Benchmarking the Length Measurement Capabilities of the National Institute of Standards and Technology

January 1, 1997

Author(s)

Richard M. Silver, J Land, Jack A. Stone Jr., Ronald G. Dixson, Bryon S. Faust, James E. Potzick, Michael T. Postek, et al

A cross-section of measurements from the Precision Engineering Division within the National Institute of Standards and Technology is benchmarked against other...

Performance of R-22 Alternative Refrigerants in a System With Cross-Flow and Counter-Flow Heat Exchangers (NISTIR 5945)

January 1, 1997

Author(s)

M H. Kim, Piotr A. Domanski, David Didion

This report presents results of performance tests of R-22 and four alternative fluids, R-134a, R-32/134a (30/70), R-407C, and R-410A, at operating conditions...

Interlaboratory Comparison on High temperature Superconductor Critical-current Measurements

January 1, 1997

Author(s)

J A. Wiejaczka, Loren F. Goodrich

Report of External Review of NIST NAMT Project on Nanomanufacturing of Atom-Based Dimensional Standards

January 1, 1997

Author(s)

J Land, Dennis A. Swyt

This report summarizes a workshop held on August 15, 1996, which provided an opportunity to U.S. industry in distributed and virtual manufacturing technologies...

Extension of the NIST AC-DC Difference Calibration Service for Current to 100 kHz

January 1, 1997

Author(s)

Joseph R. Kinard Jr., Thomas E. Lipe Jr., Clifton B. Childers

Electron Interactions with CCl2F2

January 1, 1997

Author(s)

Loucas G. Christophorou, James K. Olthoff, Yicheng Wang

Electron Interactions with CHF3

January 1, 1997

Author(s)

Loucas G. Christophorou, James K. Olthoff, MVVS. Rao

Economic analysis of research spillovers implications for the advanced technology program:

December 1, 1996

Author(s)

Adam B Jaffe

Mechanical Properties of Aluminum Nitride Substrates

December 1, 1996

Author(s)

Jay S. Wallace, Lin-Sien H. Lum

Aluminum nitride (AlN),because of its high thermal conductivity, is seeing increased use for heat management applications of semiconductor devices. With the...

The Matrix Market Exchange Formats: Initial Design

December 1, 1996

Author(s)

Ronald F. Boisvert, Roldan Pozo, K Remington

CSTL FY 1996 Technical Activities

December 1, 1996

Author(s)

Hratch G. Semerjian, W Koch

Bombardment Induced Electron-Capture Processes at Sodium Halide Surfaces

December 1, 1996

Author(s)

J Fine, M Szymonski, J Kolodziej, M Yoshitake, K Franzreb

Near-IR FT-Raman Microspectroscopy of Two Materials Systems: CVD Diamond and Zirconia Ceramics

December 1, 1996

Author(s)

E S. Etz

Standard Reference Material 1747: Tin Freezing-Point Cell and Standard Reference Material 1748: Zinc Freezing-Point Cell

December 1, 1996

Author(s)

Gregory F. Strouse, A T. Ince

Feature-Based Control of a Machining Center

December 1, 1996

Author(s)

Thomas R. Kramer, Frederick M. Proctor

Control, Standards

Representation of Axes for Geometric Fitting

December 1, 1996

Author(s)

Ted Hopp

We review methods for representing geometric axes in three dimensions and discuss why these methods have undesirable properties for geometric fitting...

Computer Analysis of the Moisture Performance of Roof Constructions in the U.S. DOE Moisture Control Handbook.

December 1, 1996

Author(s)

D M. Burch, G A. Tsongas, B A. Thornton, G N. Walton

A new mathematical model, called the MOIST Attic Model, that predicts the transfer of heat and moisture in ventilated or unventilated roof cavities is presented...

Comparison of Fire Model Predictions With Experiments Conducted in a Hangar With a 15 Meter Ceiling.

December 1, 1996

Author(s)

William D. Davis, Kathy A. Notarianni, Kevin B. McGrattan

The National Aeronautics and Space Administration together with the National Institute of Standards and Technology are in the fourth year of a five year project...

User's Guide for the SQL Test Suite, Version 6.0

December 1, 1996

Author(s)

David W. Flater, Leonard J. Gallagher, S Hurwitz, J M. Sullivan

Simulating the Effects of HVAC Induced Air Flow From Slot Diffusers on Detector Response (NISTIR 5908)

December 1, 1996

Author(s)

J H. Klote, Glenn P. Forney, William D. Davis, Richard W. Bukowski

Rapid activation of fire protection systems in response to a growing fire is one of the important factors required to provide for life safety and property...

Design, Integration, and Evaluation of Form-Based Handprint and OCR Systems

December 1, 1996

Author(s)

Charles L. Wilson, J Geist, Michael D. Garris, R Chellappa

User's Guide for RDA/SQL Validation Tests

December 1, 1996

Author(s)

J M. Sullivan, Kevin G. Brady

Intrinsic Capacitances and Inductances of Quantum Hall Effect Devices

November 1, 1996

Author(s)

Marvin E. Cage, Anne-Marie Jeffery

The Application Protocol Information Base World Wide Web Gateway

November 1, 1996

Author(s)

Joshua Lubell

The Application Protocol Information Base (APIB) is an on-line repository of documents for the Standard for the Exchange of Product model data (STEP, officially...

Dielectric Measurements Using a Reentrant Cavity: Mode-Matching Analysis

November 1, 1996

Author(s)

James R. Baker-Jarvis, Billy F. Riddle

Guidelines for AIM Development

November 1, 1996

Author(s)

Allison Barnard Feeney, M Gilbert, Y Yang

The Standard for the Exchange of Product Model Data (STEP) is being developed under the auspices of the International Organization for Standardization (ISO)...

Advanced Deburring and Chamfering System (ADACS): Final Report

October 31, 1996

Author(s)

Keith A. Stouffer, Robert Russell, R Archacki, T Engel, R Dansereau, A Grot

Robotics & Intelligent Systems, Control, Standards

Analytical Model of Pyrolysis for a Finite Thickness Sample on a Semi-Infinite Base (NISTIR 5904)

October 28, 1996

Author(s)

Kathryn M. Butler

To test the flammability of materials, a sample is placed on a substrate and exposed to a uniform heat flux. Measurements include sample mass and upper and...

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