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NIST Pubs

MGGHAT User's Guide Version 1.1

January 1, 1997

Author(s)

William F. Mitchell

CHEMICAL AND PHYSICAL INFLUENCES OF HALOGENATED FIRE SUPPRESSANTS

January 1, 1997

Author(s)

Valeri I. Babushok, Anthony P. Hamins, Wing Tsang, T Noto

The specific mechanisms by which fire suppressants influence flame properties have been determined on the basis of computer simulations. Attention is focussed...

DNA Molecules as Standard Reference Materials I: Development of DNA Identification Sequences and Human Mitochondrial DNA Reference Sequences

January 1, 1997

Author(s)

K H. McKenney, J Hoskins, J Tian, Prasad T. Reddy

NIST Form-Based Handprint Recognition System

January 1, 1997

Author(s)

Michael D. Garris, J L. Blue, Gerald T. Candela, Patrick J. Grother, Stanley Janet, Charles L. Wilson

Combined Optical and Neural Network Fingerprint Matching

January 1, 1997

Author(s)

Charles L. Wilson, Craig I. Watson, E G. Paek

NIST Measurement Services: Photometric Calibration

January 1, 1997

Author(s)

Yoshihiro Ohno

Information Technology Laboratory Technical Accomplishments 1996

January 1, 1997

Author(s)

Elizabeth B. Lennon, Shirley M. Radack

Heat Capacity of Liquids: Critical Review and Recommended Values - Monograph No. 6

January 1, 1997

Author(s)

M. Zabransky, Vlastimil Ruzicka, V. Majer, E. S. Domalski

Antireflecting-Chromium Linewidth Standard, SRM 473, for Calibration of Optical Microscope Linewidth Measuring System

January 1, 1997

Author(s)

James E. Potzick

This document describes the physical characteristics of Standard Reference Material SRM 473, provides instructions for its use in calibrating optical photomask...

Thermal Expansion of Long Slender Rods With Forced Convection Cooling Along the Rod Length

January 1, 1997

Author(s)

F Rudder

This report presents explicit analytical expressions for the thermal expansion of a rod with heat input at one end and forced convection cooling along the...

A Compilation of Energy Levels and Wavelengths for the Spectrum of Neutral Beryllium (Be I)

January 1, 1997

Author(s)

Alexander Kramida, William C. Martin

Electron-Impact Total Ionization Cross Sections of CH AND C₂H₂

January 1, 1997

Author(s)

Y -. Kim, M E. Rudd

Energy-Filtered High-Resolution Electron Microscopy for Quantitative Solid State Structure Determination

January 1, 1997

Author(s)

Z L. Wang, D van Heerden, Daniel Josell, Alexander J. Shapiro

Optimum Design of a Ceramic Tensile Creep Specimen Using a Finite Element Method

January 1, 1997

Author(s)

Zuoyi Wang, C. K. Chiang, Tze J. Chuang

Water Calorimetry: The Heat Defect

January 1, 1997

Author(s)

Norman V. Klassen, C K. Ross

An Analysis of AP213 for Usage as a Process Plan Exchange Format

January 1, 1997

Author(s)

Michael Iuliano, Albert W. Jones, Shaw C. Feng

The objective of the Computer-Aided Manufacturing Engineering (CAME) project is to identify generic interfaces which can be used to demonstrate the integration...

The Role of Product Data Management in the Manufacturing Engineering ToolKit

January 1, 1997

Author(s)

Michael Iuliano

A Manufacturing Engineering ToolKit (METK) is under development at the National Institute of Standards and Technology (NIST). The toolkit consists of commercial...

On the Transition of KIF/Frame Ontologies to EXPRESS

January 1, 1997

Author(s)

Peter Wilson

This repot descibes the translation of three groups of ontologies specified using the Frame variant of the Knowledge Interchange Format (KIF) language into...

Standardization and Enterprise Integration

January 1, 1997

Author(s)

Jim G. Nell

This paper presents an analysis of what it means for an enterprise to be integrated, what enterprises are really trying to achieve by integrating their...

Simulation in Japan: State-of-the-Art Update

January 1, 1997

Author(s)

Shigeki Umeda, Albert W. Jones

Computer hardware continues to decrease in cost and increase in power. Simulation vendors have hypothesized that this trend, together with new requirements for...

RISQ: A Web-Based Tool for Referencing Information on Software Quality

January 1, 1997

Author(s)

C B. Weinstock, D Wallace

Towards Extended-Cavity Grating-Tuned Mid-Infrared Diode Laser Operation

January 1, 1997

Author(s)

M M{umlat}rtz, J. S. Wells, Leo W. Hollberg, T Zibrova, N Mackie, Z Feit

Transmission Filters with Measured Optical Density at 1064 nm Wavelength ?} - SRMs 2046, 2047, 2048, 2049, 2050, 2051

January 1, 1997

Author(s)

Z M. Zhang, Thomas R. Gentile, Alan L. Migdall, Raju V. Datla

Microwave Spectra of Molecules of Astrophysical Interest. XXIV: Methanol (CH₃OH and ¹³CH₃OH)

January 1, 1997

Author(s)

L H. Xu, Francis J. Lovas

Spectral Data for Highly Ionized Atoms: Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Kr and Mo

January 1, 1997

Author(s)

T Shirai, J Sugar, Wolfgang L. Wiese

Technical Activities 1997-Chemical Science and Technology Laboratory

January 1, 1997

Author(s)

Hratch G. Semerjian, W Koch

This report summarizes the research and services provided by the Chemical Science and Technology Laboratory of the National Institute of Standards and...

Proceedings of the First Process Specification Language (PSL) Roundtable

January 1, 1997

Author(s)

Craig I. Schlenoff, Amy Knutilla, Steven R. Ray

On April, 1997, the Process Specification Language (PSL) Project held a Roundtable discussion at the National Institute of Standards and Technology (NIST). The...

Development of Manufacturing Systems Models Using VRML

January 1, 1997

Author(s)

V Krishnamurthy, Michael Iuliano, Charles R. McLean

The System Integration for Manufacturing Applications (SIMA) Program is a major internal effort being undertaken at the National Institute of Standards and...

A Repository of Designs for Process and Assembly Planning

January 1, 1997

Author(s)

William Regli, Daniel M Gaines

This paper provides an introduction to the Design, Planning and Assembly Repository available through the National Institute of Standards and Technology (NIST)...

Metrology for Information Technology (IT)

January 1, 1997

Author(s)

Lisa Carnahan, M M. Gray, Michael Hogan, Ted Hopp, Jeffrey Horlick, Gordon E. Lyon, Elena R. Messina

The scope of this white paper is the testing or measuring of digital information technology (IT) systems attributes or proporties; the use of digitial IT...

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