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NIST Pubs

Criteria for United States Geological Survey (USGS) Recognizing Certificate Issuing Organizations: Functions and Requirements

May 1, 1998

Author(s)

W H. Dashiell, L A. Johnson, Lynne S. Rosenthal

This document describes an overview of the model for United States Geological Survey (USGS) recognition of private sector Certification Issuing Organizations...

Overview of Model for United States Geological Survey Recognition of Spatial Data Transfer Standard (SDTS) Topological Vector Profile (TVP) Certification System

May 1, 1998

Author(s)

W H. Dashiell, L A. Johnson, Lynne S. Rosenthal

This document describes an overview of the model for United States Geological Survey (USGS) recognition of private sector certification issuing organizations...

Model for Test Method Executive Control Committee (TMECC) Organization and Procedures Part of United States Geological Survey Recognition of Spatial Data Transfer Standard (SDTS) Topological Vector Profile (TVP) Certification System

May 1, 1998

Author(s)

W H. Dashiell, L A. Johnson, Lynne S. Rosenthal

This document describes an overview of the model for United States Geological Survey (USGS) recognition of private sector certification issuing organizations...

Criteria for United States Geological Survey (USGS) Recognizing Testing Laboratory/ies Functions and Requirements Part of United States Geological Survey Recognition of Spatial Data Transfer Standard (SDTS) Topological Vector Profile (TVP) Certification

May 1, 1998

Author(s)

W H. Dashiell, L A. Johnson, Lynne S. Rosenthal

This document describes an overview of the model for United States Geological Survey (USGS) recognition of private sector Certification Issuing Organizations...

Process Specification Language: An Analysis of Existing Representations

May 1, 1998

Author(s)

Amy Knutilla, Craig I. Schlenoff, Steven R. Ray, Stephen T. Polyak, Austin Tate, S C. Cheah, Richard C. Anderson

The goal of the National Institute of Standards and Technology (NIST) Process Specification Language (PSL) project is to investigate and arrive at a neutral...

A Portable Calibrator for Across-the-Road Radar Systems

May 1, 1998

Author(s)

Arthur Ondrejka, Robert T. Johnk

Electronics and Electrical Engineering Laboratory Technical Progress Bulletin Covering Laboratory Programs, October to December 1997, with 1998 Events Calendar

May 1, 1998

Author(s)

J M. Rohrbaugh

This is the sixtieth issue of a quarterly publication providing information on the technical work of the National Institute of Standards and Technology...

NIST Calibration Service for Capacitance Standards at Low Frequencies

April 1, 1998

Author(s)

Yui-May Chang, Summerfield B. Tillett

This document describes the capacitance calibration service provided by NIST, including measurement procedures and systems used to calibrate capacitance...

Information Technology Security Training Requirements: A Role- and Performance-Based Model

April 1, 1998

Author(s)

Mark Wilson, D E. deZafra, S I. Pitcher, J D. Tressler, J B. Ippolito

This document supersedes NIST 500-172, Computer Security Training Guidelines, published in 1989. The new document supports the Computer Security Act (Public Law...

Federal Implementation Guideline for Electronic Data Interchange ASC X12 003040 Trans. Set 838 Trading partner profile-Rev 1 (Confirmation of Vendor Registration) Implementation Convention

April 1, 1998

Author(s)

J Favreau

The ASC X12 003040 Transaction Set 838 Trading partner profile - Revision 1 (Confirmation of Vendor Registration) Implementation Convention defines the Federal...

Evaluation of Intumescent Body Panel Coatings in Simulated Post-Accident Vehicle Fires (NISTIR 6157)

April 1, 1998

Author(s)

Anthony P. Hamins

This report describes a portion of the work undertaken in Project B.4 (Evaluation of Potential Fire Intervention Materials and Technologies) of the Cooperative...

BEES 1.0: Building for Environmental and Economic Sustainability Technical Manual and User Guide

April 1, 1998

Author(s)

Barbara C. Lippiatt

The BEES (Building for Environmental and Economic Sustainability) version 1.0 software implements a rational, systematic technique for selecting environmentally...

Energy Price Indices and Discount Factors for Life-Cycle Cost Analysis - April 1998. Annual Supplement to NIST Handbook 135 and NBS Special Publication 709

April 1, 1998

Author(s)

S Fuller

This is the April 1998 edition of energy price indices and discount factors for performing life-cycle cost analyses of energy and water conservation and...

Preparation and Characterization of Polymer/Dendrimer Blends Progress Report 3/31/98

April 1, 1998

Author(s)

Eric J. Amis, Barry J. Bauer, A Topp, T J. Prosa, Da-Wei Liu, C L. Jackson, Alamgir Karim, B D. Ermi, K A. Barnes, A Nakatani, G Nisato, R Ivkov

Dendrimer and dendrigraft solutions, blends, and interpenetrating polymer networks are characterized by small angle neutron and x-ray scattering, reflectivity...

Experience Report: Comparing an Automated Conformance Test Development Approach with a Traditional Development Approach

April 1, 1998

Author(s)

Alan H. Goldfine, G E. Fisher, Lynne S. Rosenthal

Cargo Container Transfer Requirements for the Mobile Offshore Base

April 1, 1998

Author(s)

Roger V. Bostelman, Kenneth R. Goodwin

The purpose of this requirements statement is to serve as a guideline to Mobile Offshore Base (MOB) concept developers, so that cargo handling requirements are...

Federal Implementation Guideline for Electronic Data Interchange; ASC X12 003060 Transaction Set 861W Receiving Advice/Acceptance Certificate; (Hazardous Waste Material Receipt) Implementation Convention

April 1, 1998

Author(s)

J Favreau

The ASC X12 003060 Transaction Set 861 Receiving Advice/Acceptance Certificate (Hazardous Waste Material Receipt) defines the Federal Government's...

Evaluation of Applications on a Loosely Coupled Cluster

April 1, 1998

Author(s)

Wayne J. Salamon, Alan Mink, Michael D. Indovina, M M. Courson

The EFFective Manager Tool for Software Developers

April 1, 1998

Author(s)

D Wallace, M L. Zimmerman

The collection and analysis of software error, fault, and failure data from many high integrity systems may yield reference data for matching development and...

Experience Report: Comparing an Automated Conformance Test Development Approach With a Traditional Development Approach

April 1, 1998

Author(s)

Alan H. Goldfine, G E. Fisher, Lynne S. Rosenthal

This Interagency Report documents a recent project at NIST that investigated the effectiveness of using automated software test generation tools to help develop...

A Fortran 90 Interface for OpenGL: Revised January 1998

April 1, 1998

Author(s)

William F. Mitchell

It is important to provide a good fortran interface to OpenGL and related libraries for scientific visualization in mathematical software. OpenGL currently...

Fracture Toughness Data for Brittle Materials

April 1, 1998

Author(s)

R G. Munro, Stephen W. Freiman, T L. Baker

Fracture toughness data, as represented by the critical stress intensity factor, K Ic, and the fracture energy, γ, have been compiled from publicly accessible...

Molecular Dynamics Simulation of Tethered Chains

April 1, 1998

Author(s)

Raymond D. Mountain, Joseph B. Hubbard

A description is provided for a molecular dynamics code that simulates the dynamics of long chain molecules tethered to a smooth surface. The operation of the...

Summary Report of NIST/MSC Workshop on Traceability in Length

April 1, 1998

Author(s)

Dennis A. Swyt

The National Institute of Standards and Technology, in conjunction with the Measurement Science Conference, conducted an industry-needs workshop on February 4...

Optical Fiber Connectors: An Interlaboratory Comparison of Measurements of Endface Geometry

April 1, 1998

Author(s)

Timothy J. Drapela

An interlaboratory measurement comparison, dealing with geometrical parameters of convex spherically polished optical fiber connector ferrule endfaces, was...

Semiconductor Measurement Technology: Thin Film Reference Materials Development; Final Report for CRADA CN-1364

April 1, 1998

Author(s)

Barbara J. Belzer, K Eberhardt, Deane Chandler-Horowitz, James R. Ehrstein, P. Durgapal

Independent single-wavelength ellipsometric measurements of thermally grown silicon dioxide thin films on silicon substrates and data analyses were compared...

Semiconductor Measurement Techonology: CN-1364 NIST/ VLSI Thin Film Standards: Final Report

April 1, 1998

Author(s)

Barbara J. Belzer, K Eberhardt, Deane Chandler-Horowitz, James R. Ehrstein, P. Durgapal

NIST List of Publications 94: Electrical and Electronic Metrology: A Bibliography of NIST Electricity Division's Publications 1968-1998.

March 29, 1998

Author(s)

Ruth Ann Schmeit

This bibliography covers publications by the Electricity Division, Electronics and Electrical Engineering Laboratory, National Institute and Technology, plus...

Management of Risks in Information Systems: Practices of Successful Organizations

March 19, 1998

Author(s)

Shirley M. Radack

This bulletin summarizes the findings of a U.S. General Accounting Office (GA)) study of the information security programs and management practices of eight non...

Federal Implementation Guideline for Electronic Data Interchange; ASC X12 003050 Transaction Set 861; Receiving Advice/Acceptance Certificate; Implementation Convention

March 5, 1998

Author(s)

J Favreau

The ASC X12 003050 Transaction Set 861 Receiving Advice/Acceptance Certificate defines the Federal Government's interpretation of the use of ASC X12 003050...

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