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NIST Pubs

Information Security Guide for Government Executives

Author(s)
Pauline Bowen, Elizabeth Chew, Joan Hash
Information Security Guide for Government Executives provides a broad overview of information security program concepts to assist senior leaders in

Calibrated Overlay Wafer Standard

Author(s)
Michael T. Stocker, Richard M. Silver, Ravikiran Attota, Jay S. Jun
This document describes the physical characteristics of Standard Reference Material SRM 5000, provides guidance for its use in calibrating overlay (OL) tools

Convective Instabilities in Two Liquid Layers

Author(s)
Geoffrey B. McFadden, Sam R. Coriell, Katharine F. Gurski, David Cotrell
We perform linear stability calculations for horizontal fluid bilayers, taking into account both buoyancy effects and thermocapillary effects in the presence of

PIV Card to Reader Interoperability Guidelines

Author(s)
James F. Dray Jr., April Giles, Michael Kelley, Ramaswamy Chandramouli
The purpose of this document is to present recommendations for Personal Identity Verification (PIV) card readers in the area of performance and communications

A Roadmap For Metrology Interoperability

Author(s)
John A. Horst, S McSpadden
An International Metrology Interoperability Summit (IMIS) was held March 28 - 30, 2006 at NIST in Gaithersburg, MD. Workers and decision makers in a variety of

Synthetic Incoherence Via Scanned Gaussian Beams

Author(s)
Zachary H. Levine
Tomography, in most formulations, requires an incoherent signal. For a conventional transmission electron microscope, the coherence of the beam often results in
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