Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Bayesian Tomography for Projections With an Arbitrary Transmission Function With an Application in Electron Microscopy

Published

Author(s)

Zachary H. Levine, Anthony J. Kearsley, John G. Hagedorn

Abstract

The vast majority of the developments in tomography assume that the transmission of the probe trhought he sample follows Beer s Law, i.e., the rule of exponential attenuation. However, for transmission electron microscopy of samples a few times their mean free path, Beer s Law is no longer an accurate description of the transmission of the probe as a function of the sample thickness. Recent simulations have demonstrated accounting ofrthe correct transmission function leads to superior tomographic reconstructions for a photonic band gap sample 8000 nm square. A previous paper assumed 180 degree data was available. Here we consider a more realistic case in which only 140 degree data is available. To treat the limited angle problem, the Bayesian formalism of Bouman and Sauer is generalized to allow an arbitrary transmission function. The new formalism is identical to that of Bouman and Sauer when the transmission function obeys Beer s Law. The examples suggest that using the physical transmission function is a requirement for performing limited angle reconstructions.
Citation
Journal of Research (NIST JRES) -
Volume
111 No. 6

Keywords

Bayesian tomography, Beer's Law, maximum likelihood, multiple scattering, photonic band gap, Physical transmission function, transmission electron microscope, transmission-thickness relation

Citation

Levine, Z. , Kearsley, A. and Hagedorn, J. (2006), Bayesian Tomography for Projections With an Arbitrary Transmission Function With an Application in Electron Microscopy, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD (Accessed April 25, 2024)
Created December 1, 2006, Updated February 17, 2017