Levine, Z.
(2006),
Synthetic Incoherence Via Scanned Gaussian Beams, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed April 28, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Synthetic Incoherence Via Scanned Gaussian Beams
Published
Author(s)
Abstract
Tomography, in most formulations, requires an incoherent signal. For a conventional transmission electron microscope, the coherence of the beam often results in diffraction effects which limit the utility of a tilt series with conventional tomographic reconstruction algorithms. In this paper, an analytic solution is given to a scanned Gaussian beam which reduces the beam coherence to be effectively incoherent for medium-size (of order 100 voxels thick) tomographic applications. The scanned Gaussian beam leads to more incoherence than hollow-cone rotating beam illumination.Citation
Journal of Research (NIST JRES) -
Volume
111 No. 6
NIST Pub Series
Pub Type
NIST Pubs
Keywords
electron microscopy, Gaussian beams, incoherence, synthetic incoherence
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 1, 2006, Updated February 17, 2017