Levine, Z.
(2006),
Synthetic Incoherence Via Scanned Gaussian Beams, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed December 6, 2023)
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Synthetic Incoherence Via Scanned Gaussian Beams
Published
Author(s)
Abstract
Tomography, in most formulations, requires an incoherent signal. For a conventional transmission electron microscope, the coherence of the beam often results in diffraction effects which limit the utility of a tilt series with conventional tomographic reconstruction algorithms. In this paper, an analytic solution is given to a scanned Gaussian beam which reduces the beam coherence to be effectively incoherent for medium-size (of order 100 voxels thick) tomographic applications. The scanned Gaussian beam leads to more incoherence than hollow-cone rotating beam illumination.Citation
Journal of Research (NIST JRES) -
Volume
111 No. 6
NIST Pub Series
Pub Type
NIST Pubs
Keywords
electron microscopy, Gaussian beams, incoherence, synthetic incoherence
Citation
Created December 1, 2006, Updated February 17, 2017