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We have systematically measured two-level fluctuator [TLF] noise in a single-electron tunneling transistor. From the amplitude, duty cycle, and presence of
A new method of describing designs by combining the paradigms of shape aglebras and predicate logic representations is presented. Representing shapes and
We demonstrate an automated polarimeter based on a rotating polarizer for the measurement oflinear retardance independent oflaser power and detector gain. The
This paper reports recent progress in the development of a generic molecular dynamics model that accounts for the major chemical reactions involved in the
A Bard, K K. Berggren, J L. Wilbur, John D. Gillaspy, S L. Rolston, Jabez J. McClelland, William D. Phillips, M Prentiss, G M. Whitesides
We used a beam of noble gas atoms in a metastable excited state to expose a thin (1.5nm self-assembled monolayer resist applied over a gold-coated silicon wafer
This paper proposes a method to extend the current ISO Guide to the Expression of Uncertainty in Measurement to include the case of known, but uncorrected
The Bienaym?-Chebyshev Inequality provides a quantitative bound on the level of confidence of a measurement with known combined standard uncertainty and assumed
Direct implementation of extended arithmetic operators on fuzzy numbers is computationally complex. Implementation of the extension principle is equivalent to
Michael Gruninger, Craig I. Schlenoff, Amy Knutilla, Steven R. Ray
This paper addresses the issue of process ontology integration using a complete set of process information requirements as its basis. The goals of the paper
Paul Rice, Stephen E. Russek, J Hoinville, Michael H. Kelley
We have further developed the NIST magnetic imaging reference sample to include a magnetic pattern which can indicate the magnetic polarity of a magnetic force
This article introduces a Special Issue of StandardView, in which some of the critical measurement issues that challenge the information technology community
William T. Estler, Christopher J. Evans, Lianzhen Shao
We analyze a general multiposition comparator measurement procedure that leads to partial removal of artifact error for a class of problems including roundness