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Journals

Interleave in Peace, or Interleave in Pieces

Author(s)
Isabel M. Beichl, F Sullivan
Bit interleaving is a technique that sometimes can collapse a problem of high-dimensional data to one of lower dimensional data. Our favorite use is going from

Multiple Small-Angle Neutron Scattering

Author(s)
Gabrielle G. Long, Susan Krueger, Andrew J. Allen
Over the past decade, a multiple small-angle neutron scattering (MSANS) formalism has been developed to enable researchers to derive microstructural parameters

Masked Ion Beam Lithography with Highly Charged Ions

Author(s)
John D. Gillaspy, D Parks, L P. Ratliff
Masked ion beam lithography using highly charged ions is demonstrated for the first time by producing an array of hundreds of ordered micrometer wide dots using

Diffraction Anomalous Fine Structure Study of Strained GA1-xInxAs on GaAs(001)

Author(s)
Joseph C. Woicik, J O. Cross, Charles E. Bouldin, Bruce D. Ravel, J G. Pellegrino, B W. Steiner, S G. Bompadre, L B. Sorensen, K E. Miyano, J P. Kirkland
Diffraction anomalous fine-structure measurements performed at both the Ga and As K edges have determined the Ga-As bond length to be 2.442 ± 0.005 {Angstrom}
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