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Journals

Optical detection of radio waves through a nanomechanical transducer

Author(s)
Jacob M. Taylor, Tolga Bagci, A Simonsen, Silvan Schmid, L Villanueva, Emil Zeuthen, Anders Sorensen, Koji Usami, A Schliesser, E.S. Polzik
Low-loss transmission and sensitive recovery of weak radio-frequency (rf) and mi- crowave signals is an ubiquitous technological challenge, crucial in fields as...

Dropwise Condensation of Low Surface Tension Fluids on Omniphobic Surfaces

Author(s)
John H. Scott, Konrad Rykaczewski, Adam T. Paxson, Matthew E. Staymates, Marlon L. Walker, Xiaoda Sun, Sushant Anand, Siddarth Srinivasan, Gareth H. McKinley, Jeff Chinn, Kripa Varanasi
Compared to the significant body of work devoted to surface engineering for promoting dropwise condensation heat transfer of steam, much less attention has been...

Characterization of InGaN quantum disks in GaN nanowires

Author(s)
Alexana Roshko, Roy H. Geiss, John B. Schlager, Matthew D. Brubaker, Kristine A. Bertness, Norman A. Sanford, Todd E. Harvey
Catalyst-free GaN nanowires with InGaN quantum disks (QDs) were characterized by scanning/transmission elec-tron microscopy (S/TEM) and photoluminescence. A va...

Metrology Needs for TSV Fabrication

Author(s)
Victor H. Vartanian, Richard A. Allen, Larry Smith, Klaus Hummler, Steve Olson, Brian Sapp
This paper focuses on the metrology needs and challenges of through silicon via (TSV) fabrication, consisting of TSV etch, liner, barrier, and seed (L/B/S)...

Stair Evacuation of People with Mobility Impairments

Author(s)
Erica D. Kuligowski, Richard Peacock, Bryan Hoskins, Emily Wiess
The time that it takes a population to reach safety when descending a stairwell during building evacuations is typically described by measureable engineering...

Calibrations for Millimeter-Wave Silicon Transistor Characterization

Author(s)
Dylan F. Williams, Phillip Corson, Sharma Jahnavi, Krishnaswamy Harish, Wei Tai, George Zacharias, Ricketts David, Watson Paul, Dacquay Eric, Voinigescu Sorin
This paper compares on-wafer thru-reflect-line (TRL) and off-wafer short-open-load-thru (SOLT) and line-reflect-reflect-match (LRRM) vector-network-analyzer...
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