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Journals

Scaling Behavior of Anisotropy Relaxation in Deformed Polymers

Author(s)
Christopher N. Lam, Wen-Sheng Xu, Wei-Ren Chen, Zhe Wang, Christopher B. Stanley, Jan-Michael Y. Carrillo, David Uhrig, Weiyu Wang, Kunlun Hong, Yun Liu, Lionel Porcar, Changwoo Do, Gregory S. Smith, Bobby G. Sumpter, Yangyang Wang
Drawing an analogy to the paradigm of quasi-elastic neutron scattering, we present a general approach for quantitatively investigating the spatiotemporal

Core-Shell p-i-n GaN Nanowire LEDs by N-polar Selective Area Growth

Author(s)
Matthew D. Brubaker, Kristen L. Genter, Bryan T. Spann, Alexana Roshko, Paul T. Blanchard, Todd E. Harvey, Kristine A. Bertness
GaN nanowire LEDs with radial p-i-n junctions were grown by molecular beam epitaxy using N- polar selective area growth on Si(111) substrates. The N-polar

Evaluation of Lateral Resolution of Light Field Cameras

Author(s)
Sowon Joy Yoon, Peter Bajcsy, Maritoni A. Litorja, James J. Filliben
Light field cameras are an emerging imaging device for acquiring 3-D information of a scene by capturing a field of light rays traveling in space. As light

Nano-Sized Ferrite Particles for Magnetic Resonance Imaging Thermometry

Author(s)
Janusz H. Hankiewicz, J A. Stoll, John Stroud, J Davidson, K L. Livesey, K Tvrdy, Alexana Roshko, Stephen E. Russek, Karl Stupic, P Bilski, Robert E. Camley
Recently, we reported the use of magnetic particles as temperature indicators in magnetic resonance imaging thermometry (tMRI). In this method, the brightness

Data Quality and Assessment, Validation Methods and Error Propagation through the Simulation Software: Report from the Round-Table Discussion at the 10th World Congress of Chemical Engineering in Barcelona (October 1-5, 2017)

Author(s)
Paul M. Mathias, Ana Soto, Ljudmila Fele-Zilnik, Jean-Charles de Hemptinne, Ala Bazyleva, Jens Abildskov
The issues of data quality and propagation of data uncertainties into process design and plant uncertainties are of great current interest, and hence two

True value and uncertainty in measurement

Author(s)
Raghu N. Kacker
We will discuss the concept of true value and its connection with the uncertainty in measurement as defined in the Guide to the Expression of Uncertainty in
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