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Journals

Total Dielectric Function: Algebraic Sign, Electron-Lattice Response, and Superconductivity

August 1, 1988

Author(s)

P Allen, Marvin Cohen, David R. Penn

The interaction between two test charges in a solid can be described in terms of a total dielectric function that includes electronic and lattice polarization...

18th International Conference on Low Temperature Physics (LT-18)

August 1, 1988

Author(s)

John M. Moreland, H Hirabayashi

NBS Vision System in the AMRF

August 1, 1988

Author(s)

M Nashman, K Chaconas

AMRF, Vision

Measurement of Shielding Effectiveness of Different Cable and Shielding Configurations by Mode-Stirred Techniques

August 1, 1988

Author(s)

R L. Jesch

A Pulsed Time-of-flight Mass Spectrometer for Liquid Secondary Ion Mass Spectrometry

July 12, 1988

Author(s)

James K. Olthoff, I. A. Lys, R. J. Cotter

A Coplanar Probe to Microstrip Transition

July 1, 1988

Author(s)

Dylan F. Williams, Tom H. Miers

A transition between a coplanar probe and a microstrip transmission line is reported. The transition is significant in that it does not require substrate via...

Waveguide Loss Measurement Using Photothermal Deflection

July 1, 1988

Author(s)

Robert K. Hickernell, Donald R. Larson, Robert J. Phelan, L. E. Larson

Valence-Band Effective Masses of GaAs

July 1, 1988

Author(s)

J R. Lowney, A. H. Kahn

Framework for Representing and Reasoning about Three-Dimensional Objects for Vision

June 30, 1988

Author(s)

E Walker, Martin Herman, T Kanade

The capabilities for representing and reasoning about three-dimensional objects are essential for knowledge-based, 3D photo-interpretation system that combine...

Josephson-junction model of critical current in granular Y1Ba2Cu3O7-delta superconductors

June 1, 1988

Author(s)

John (Jack) W. Ekin, R. L. Peterson

We calculate the transport critical-current density in a granular superconductor in magnetic fileds below about 5 x 10^-3 T. The field dependence in this region...

Shape Selectivity in Liquid and Gas Chromatography: Polymeric Octadecylsilane and Liquid Crystalline Stationary Phases

June 1, 1988

Author(s)

Stephen A. Wise, Lane C. Sander, H.-C.K. Chang, K. E. Markides, M. L. Lee

High Resolution Imaging of Magnetization

June 1, 1988

Author(s)

Daniel T. Pierce, John Unguris, Robert Celotta

Performance Measures of a Robotic Micropositioner

June 1, 1988

Author(s)

Jonathan W. Lee, James S. Albus, Nicholas G. Dagalakis, T M. Tsai

This work describes a computer simulation of the dynamics and control of a robotic micropositioner. The robotic micropositioner is a parallel link manipulator...

Josephson Junction Model of Critical Current in Granular Y₁Ba₂Cu₃O_7-δ

June 1, 1988

Author(s)

R. L. Peterson, John (Jack) W. Ekin

Optimal Control of a Flexible Robot Arm

June 1, 1988

Author(s)

Jonathan W. Lee, B Wang

The work is a computer simulation of the control of a flexible robot arm. The dynamic equations for a single-link flexible robot arm have been derived...

Error Analysis Techniques for Planar Near-Field Measurements

June 1, 1988

Author(s)

Allen C. Newell

Improved Polarization Measurements Using a Modified Three Antenna Technique

June 1, 1988

Author(s)

Allen C. Newell

Fast Optical Detector Deposited on Dielectric Channel Waveguides

June 1, 1988

Author(s)

Donald R. Larson, Robert J. Phelan

Efficient and Accurate Method for Calculating and Representing Power Density in the Near Zone of Microwave Antennas

June 1, 1988

Author(s)

R L. Lewis, Allen C. Newell

A Brief History of Near-Field Measurements of Antennas at the National Bureau of Standards

June 1, 1988

Author(s)

R C. Baird, Allen C. Newell, Carl F. Stubenrauch

Effect of Random Errors in Planar Near-Field Measurement

June 1, 1988

Author(s)

Allen C. Newell, Carl F. Stubenrauch

Accurate Determination of Planar Near-Field Correction Parameters for Linearly Polarized Probes

June 1, 1988

Author(s)

Andrew G. Repjar, Allen C. Newell, Michael H. Francis

Domain Images of Ultrathin Fe Films on Ag(100)

May 30, 1988

Author(s)

J L. Robins, Robert Celotta, John Unguris, Daniel T. Pierce, B Jonker, G Prinz

Scanning electron microscopy with electron polarization analysis has been used to image domains of ultrathin Fe films grown epitaxially on a Ag(100) substrate...