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PUBLICATIONS

XUV Characterization Comparison of Mo/Si Multilayer Coating,

Published

Author(s)

D L. Windt, W K. Waskiewicz, G D. Kubiak, T W. Barbee, Jr, R N. Watts
Citation
X-Ray/EUV Optics for Astronomy Microscopy Polarimetry and Projection Lithography
Pub Type
Journals

Citation

Windt, D. , Waskiewicz, W. , Kubiak, G. and Barbee, T. (1991), XUV Characterization Comparison of Mo/Si Multilayer Coating,, X-Ray/EUV Optics for Astronomy Microscopy Polarimetry and Projection Lithography (Accessed April 26, 2024)

Created December 31, 1990, Updated October 12, 2021