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Conferences

Objective measurement and characterization of scratch standards

March 1, 1983

Author(s)

M. Young

The manufacture of scratch standards for use with MIL-0-13830A has been hampered by the lack of an objective measurement technique, The U.S. National Bureau of

A New Method for Determining the Emission Characteristics of anUnknown Interference source

March 1, 1983

Author(s)

Galen H. Koepke, M T. Ma

Evaluation of Shielded Enclosure for EMI/EMC MeasurementsWithout and With RF Anechoic Material

March 1, 1983

Author(s)

M. L. Crawford

Improving the Repeatability of EM Susceptibility Measurements of Electronic Components When Using TEM Cells

March 1, 1983

Author(s)

M. L. Crawford

An Electric and Magnetic Field Sensor Concept for SimultaneousNear-Field Electromagnetic Components When Using TEM Cells

March 1, 1983

Author(s)

Motohisa Kanda, F X. Ries, L D. Driver, R. D. Orr

Reference Manual for the Ada Programming Language

February 17, 1983

Author(s)

United States Department of Defense

A Comparison of Electron Polarization Detectors

January 1, 1983

Author(s)

Robert Celotta

Recent Advances in Electron Spin Polarization Measurements

January 1, 1983

Author(s)

Robert Celotta

Birefringence Measurements in Single Mode Optical Fiber

January 1, 1983

Author(s)

Gordon W. Day

A Computer Controlled System for Calibrating Detectors of TEA Laser Pulses

January 1, 1983

Author(s)

Philip A. Simpson

Electron-Atom Collision Studies Using Optically State Selected Beams

January 1, 1983

Author(s)

Michael H. Kelley, Robert Celotta, Daniel T. Pierce

Spin Dependence in Electron Impact Ionization of Sodium

January 1, 1983

Author(s)

Michael H. Kelley, W Rogers, Robert Celotta, Daniel T. Pierce

Magnetic Field Effects on Tensile Behavior of Alloys 304 and 310 at 4 K

January 1, 1983

Author(s)

R P. Reed, J M. Arvidson, John (Jack) W. Ekin, R H. Schoon

A Hierarchical Model-Based Control System for Inspection

January 1, 1983

Author(s)

Ted Hopp, K Lay

A control system architecture for three-axes coordinate-measuring machines, using hierarchical task-decomposition techniques, is described. This architecture is

Fiber Optics: Short-Haul and Long-Haul Measurements and Applications

January 1, 1983

Author(s)

R. L. Gallawa

The EMI Measurement Challenge

January 1, 1983

Author(s)

C K. Miller

Submicrometer Interdigital Silicon Detectors for the Measurement of Picosecond Optical Pulses

January 1, 1983

Author(s)

Robert J. Phelan, Donald R. Larson, Nolan V. Frederick, Douglas L. Franzen

The Virtual Manufacturing Cell

October 1, 1982

Author(s)

Charles R. McLean, Howard Bloom, Ted Hopp

A virtual manufacturing cell is being developed at the National Bureau of Standards as part of the control software for the Automated Manufacturing Research

The Orbiting Standards Package: A Recalibratable SatelliteInstrument Assembly for Measuring Large Earth Station Antennas

October 1, 1982

Author(s)

R C. Baird, A J. Estin

A Partial Loop Source of E and H Fields for Antenna FactorCalibration (A Loop Cell)

October 1, 1982

Author(s)

R G. Fitzgerrell

A New Method for Determining the Emission Characteristics of anUnknown Interference Source

September 1, 1982

Author(s)

Galen H. Koepke, M T. Ma

Development of the NIST Isotropic Magnetic-Field Meter (MFM-10),300 kHz to 100 MHz

September 1, 1982

Author(s)

L D. Driver, J. E. Cruz

Time Domain Sensors for Radiated Impulsive Measurements

September 1, 1982

Author(s)

Motohisa Kanda, F X. Ries

Simulation of a Modular Hierarchical Feedback System

July 1, 1982

Author(s)

Howard Bloom, Charles R. McLean, Cita M. Furlani, T J. Johnson, S Milligan, T Fortman

This guide describes a medium-sized application of the Hierarchical Control System Emulation (HCSE) which was modeled after certain aspects of the National