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A Critical Study of Emission and Susceptibility Levels ofElectrically Small Objects from Tests Inside a TEM Cell

Published

Author(s)

Ippalapalli Sreenivasiah, D. C. Chang, M T. Ma
Proceedings Title
A Critical Study of Emission and Susceptibility Levels ofElectrically Small Objects from Tests Inside a TEM Cell
Conference Dates
August 1, 1981
Conference Location
Boulder, CO, USA

Citation

Sreenivasiah, I. , Chang, D. and Ma, M. (1981), A Critical Study of Emission and Susceptibility Levels ofElectrically Small Objects from Tests Inside a TEM Cell, A Critical Study of Emission and Susceptibility Levels ofElectrically Small Objects from Tests Inside a TEM Cell, Boulder, CO, USA (Accessed April 20, 2024)
Created July 31, 1981, Updated October 12, 2021