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Conferences

UE-to-Network Relay Discovery in ProSe-enabled LTE Networks

Author(s)
Samantha M. Gamboa Quintiliani, Alexandre C. Moreaux, David W. Griffith, Richard A. Rouil
The UE-to-Network Relay functionality was introduced to Long Term Evolution (LTE) cellular networks in Release 13. In this technology, User Equipment (UEs)...

X-Ray Metrology of Nanowire/ Nanosheet FETs for Advanced Technology Nodes

Author(s)
Madhulika S. Korde, Regis J. Kline, Daniel Sunday, Nick Keller, Subhadeep Kal, Cheryl Alix, Aelen Mosden, Alain C. Diebold
The three-dimensional architectures for field effect transistors (FETs) with vertical stacking of Gate-all-Around Nanowires provide a pathway to increased...

Atom Probe Tomography using Extreme-Ultraviolet Light

Author(s)
Luis Miaja Avila, Ann C. Chiaramonti Debay, Benjamin W. Caplins, David R. Diercks, Brian Gorman, Norman A. Sanford
We present a different approach to laser-assisted atom probe tomography, where instead of using a near-UV laser for inducing a thermal transient, we use an...

On Upper Bounds for D2D Group Size

Author(s)
David W. Griffith, Aziza Ben Mosbah
In this paper, we examine the Physical Sidelink Discovery Channel (PSDCH) for out-of-coverage (OOC) Device-to-Device (D2D) Long Term Evolution (LTE) networks...

Atomic flux circuits

Author(s)
Douglas Bopp, Ellyse Taylor, Khoa Le, Susan Schima, Matthew Hummon, John Kitching
Atomic vapors are a crucial platform for precision metrology but in their simplest implementation, a thermal vapor, the intrinsic optical resonances are...

Millimeter-Wave Highly-Multipath Channel Measurements

Author(s)
Alec Weiss, Joshua Kast, Rob Jones, Jeanne Quimby, Rodney Leonhardt, Benjamin Jamroz, Peter Vouras, Dylan Williams, Kate Remley
We provide the frequency response of a high multipath propagation channel using a narrow beamwidth synthetic aperture measurement technique from 26.5 - 40 GHz.

Implementing Grain Traceability Standards: CART and Simulation

Author(s)
Frank H. Riddick, Evan K. Wallace, Scott Nieman, Joe Tevis, R. A. Ferreyra
To ensure food safety, food manufacturers need the ability to quickly identify and trace food products to all equipment and processes throughout the entire...
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