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Conferences

Quality Control of Measurements-Measurement Assurance

January 1, 1986

Author(s)

Robert M. Judish

State Selection in Electron-Atom Scattering: Spin-Polarized Electron Scattering from Optically Pumped Sodium

January 1, 1986

Author(s)

Jabez J. McClelland, Michael H. Kelley, Robert Celotta

New Techniques in Microscopy: Scanning Tunneling and Polarized Electron Microscopy

January 1, 1986

Author(s)

Robert Celotta

Integrated Automated Manufacture of Metal Parts

January 1, 1986

Author(s)

Thomas R. Kramer

This paper describes a system for the automated manufacture of metal parts developed at the National Bureau of Standards by the author and his colleagues. The...

A Knowledge Representation Scheme for Processes in an Automated Manufacturing Environment

January 1, 1986

Author(s)

Steven R. Ray

A key factor in applying advance programming concepts to an industrial manufacturing environment is the establishment of a language to specify the process steps...

Hybrid computer-optical processing with inexpensive liquid crystal television

January 1, 1986

Author(s)

M. Young, M. B. Weppner

We describe a computer-optical processing system that uses an inexpensive liquid crystal (LCD) television monitor and a selective holographic filter for...

Spin Dependence in Superelastic Electron Scattering From Excited Sodium

January 1, 1986

Author(s)

Michael H. Kelley, Robert Celotta, Jabez J. McClelland

Observations of Spin Dependence in Superelastic Scattering of Polarized Electrons from Na(3P)

January 1, 1986

Author(s)

Jabez J. McClelland, Michael H. Kelley, Robert Celotta

Magnetic Microstructure Imaging by Secondary Electron Spin Polarization Analysis

January 1, 1986

Author(s)

G Hembree, John Unguris, Robert Celotta

Losses in a Nb-Ti Superconductor as Functions of AC Field Amplitude and DC Transport Current

January 1, 1986

Author(s)

M Dragomirecky, J V. Minervini, J A. Aust, Ronald B. Goldfarb, Alan F. Clark

Quality Control in Automated Manufacturing

January 1, 1986

Author(s)

Ted Hopp, Dennis A. Swyt, T Carlton

This paper describes results of recent work by several groups at the National Bureau of Standards as they relate to quality control in automated manufacturing...

Standards for Electromagnetic Fields Measurements

January 1, 1986

Author(s)

Motohisa Kanda, E B. Larsen, Michele Borsero, P G. Galliano, I Yodoshima, N. S. Nahman

Progress in the Design of Optical Fiber Sensors for the Measurement of Pulsed Electric Currents

January 1, 1986

Author(s)

Gordon W. Day, L. R. Veeser, G. I. Chandler, R. W. Cernosek

Picosecond Pulse Waveform Error Analysis at NIST

January 1, 1986

Author(s)

W L. Gans

The Impact of Automation on NIST Noise Temperature Measurements

January 1, 1986

Author(s)

D. F. Wait

Fiber Optic Sensing of Pulsed Currents

January 1, 1986

Author(s)

L. R. Veeser, G. I. Chandler, Gordon W. Day

Pulse and Time Domain Measurements

January 1, 1986

Author(s)

R A. Lawton, S M. Riad, J R. Andrews

Development of a Cleaning and Deburring Workstation for the AMRF

December 31, 1985

Author(s)

H Mccain, R Kilmer, Karl Murphy

The National Bureau of Standards (NBS) is currently developing a facility for conduction research on automated manufacturing. This facility, called the...

Production Control Module for the AMRF

November 1, 1985

Author(s)

Albert T. Jones, Charles R. McLean

The Automated Manufacturing Research Facility (AMRF) is being established at the National Bureau of Standards. This manufacturing testbed provides a means for...

Robotics -- Past, Present, and Future

October 4, 1985

Author(s)

James S. Albus

Robotics is a system science that attempts to integrate artificial intelligence with feedback control of mechanical devices. It draws on work in pattern...