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Conferences

Anomalies Observed in Wafer Level Microwave Testing

Author(s)
Dylan F. Williams, Roger Marks, T H. Miers, A Cangellaris
Two anomalies have been observed in the course of developing planar wafer level standards for the testing of GaAs monolithic microwave integrated circuits. The

High resolution spectroscopy using fiber lasers

Author(s)
Sarah L. Gilbert
Fiber lasers show potential for use in high resolution laser spectroscopy. Tunable, single-longitudinal-mode operation has been achieved with fre.e-running
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