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Conferences

Comparison of On-Wafer Calibrations

Author(s)
Dylan F. Williams, Roger Marks, A. Davidson
A powerful new verification technique determines the measurement accuracy of scattering parameter calibrations. The technique determines the relative reference

Benchmark for the Verification of Microwave CAD Software

Author(s)
R. Furlow, R. Y. Shimoda, Dylan Williams, Roger Marks, Kuldip Gupta
A set of microstrip structures which constitute a comprehensive benchmark for the verification of microwave Computer Aided Design (CAD) software has been
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