Kessler, E.
(1992),
Sub-Nanometer Metrology for X-Ray and Gamma-Ray Wavelength Measurements, Precision Interferometric Meeting , Tucson, AZ
(Accessed October 1, 2025)
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Sub-Nanometer Metrology for X-Ray and Gamma-Ray Wavelength Measurements
Published
Author(s)
, Jr
Proceedings Title
Precision Interferometric Meeting
Conference Dates
April 7-9, 1992
Conference Location
Tucson, AZ
Conference Title
Proc. Precision Interferometric Meeting
Pub Type
Conferences
Citation
Issues
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Created May 1, 1992, Updated February 17, 2017