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PUBLICATIONS

Sub-Nanometer Metrology for X-Ray and Gamma-Ray Wavelength Measurements

Published

Author(s)

Ernest G. Kessler, Jr
Proceedings Title
Precision Interferometric Meeting
Conference Dates
April 7-9, 1992
Conference Location
Tucson, AZ
Conference Title
Proc. Precision Interferometric Meeting
Pub Type
Conferences

Citation

Kessler, E. (1992), Sub-Nanometer Metrology for X-Ray and Gamma-Ray Wavelength Measurements, Precision Interferometric Meeting , Tucson, AZ (Accessed October 10, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created May 1, 1992, Updated February 17, 2017
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