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Sub-Nanometer Metrology for X-Ray and Gamma-Ray Wavelength Measurements

Published

Author(s)

Ernest G. Kessler, Jr
Proceedings Title
Precision Interferometric Meeting
Conference Dates
April 7-9, 1992
Conference Location
Tucson, AZ
Conference Title
Proc. Precision Interferometric Meeting

Citation

Kessler, E. (1992), Sub-Nanometer Metrology for X-Ray and Gamma-Ray Wavelength Measurements, Precision Interferometric Meeting , Tucson, AZ (Accessed April 16, 2024)
Created May 1, 1992, Updated February 17, 2017