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Conferences

LLM-Assisted Relevance Assessments

Author(s)
Rikiya Takehi, Ellen Voorhees, Tetsuya Sakai, Ian Soboroff
Test collections are information retrieval tools that allow researchers to quickly and easily evaluate ranking algorithms. While test col- lections have become

Machine Learning for MPC Extraction and False Detection

Author(s)
Howard Dai, Jack Chuang, Jian Wang, Samuel Berweger, David Griffith
Multipath component (MPC) extraction is critical for channel modeling and joint communications and sensing (JCAS). Super-resolution algorithm known as CLEAN

Towards an Understanding of Robotic Bin-Picking Throughput

Author(s)
Anirudh Krishnan Komaralingam, Prem Rachakonda, Kamel Saidi, Armin Khatoonabadi
NIST is leading and supporting multiple efforts to develop standards for 3D imaging systems used for industrial automation. There are few standards for

Lab-based multi-wavelength EUV diffractometry for critical dimension metrology

Author(s)
Bryan Barnes, Aaron Chew, Nicholas Jenkins, Yunzhe Shao, Martin Sohn, Regis Kline, Daniel Sunday, Purnima Balakrishnan, Thomas Germer, Steven Grantham, Clay Klein, Stephanie Moffitt, Eric Shirley, Henry Kapteyn, MARGARET MURNANE
Background: The industry is developing extreme-ultraviolet wavelength (EUV) techniques to measure critical dimensions (CDs) in logic fabrication. As nascent
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