Conferences

A Workflow for Imaging 2D Materials using 4D STEM-in-SEM

August 04, 2019

Author(s):

Benjamin W. Caplins, Ryan M. White, Jason D. Holm, Robert R. Keller

DEVELOPING MEASUREMENT SCIENCE TO VERIFY AND VALIDATE THE IDENTIFICATION OF ROBOT WORKCELL DEGRADATION

June 14, 2019

Author(s):

Brian A. Weiss

Robot systems have become more prevalent in manufacturing operations as the technology has become more accessible to a wider range of manufacturers, especially...

BotSifter: A SDN-based Online Bot Detection Framework in Data Centers

June 10, 2019

Author(s):

Yang Guo, Douglas C. Montgomery, An Wang, Songqing Chen, Zili Zha

Botnets continue to be one of the most severe security threats plaguing the Internet. Recent years have witnessed the emergence of cloud-hosted botnets along...

Soft MUD: Implementing Manufacturer Usage Descriptions on OpenFlow SDN Switches

March 25, 2019

Author(s):

Mudumbai Ranganathan

Manufacturer Usage Descriptions are generalized network Access Control Lists (ACL) that allow manufacturers to declare intended communication patterns for...

Mechanical Property Characterization of Single Scan Laser Tracks of Nickel Superalloy 625 by Nanoindentation

March 14, 2019

Author(s):

Jordan S. Weaver, Meir Kreitman, Jarred C. Heigel, M A. Donmez

Laser based additive manufacturing of metals relies on many micro-sized welds to build a part. A simplified, well studied case of this process is a single scan...

A programmable dark-field detector for imaging two-dimensional materials in the scanning electron microscope

February 07, 2019

Author(s):

Benjamin W. Caplins, Jason D. Holm, Robert R. Keller

Unit cell orientation information is encoded in electron diffraction patterns of crystalline materials. Traditional transmission electron detectors implemented...

A Layered Graphical Model for Cloud Forensic and Mission Impact Analysis

February 01, 2019

Author(s):

Changwei Liu, Anoop Singhal, Duminda Wijesekera

In this paper, we describe a layered graphical model to analyze the impact of cyber attacks on business processes and services. Our model has three layers: the...

Parallel Self-Testing of the GHZ State with a Proof by Diagrams

January 31, 2019

Author(s):

Spencer J. Breiner, Amir Kalev, Carl A. Miller

Quantum self-testing addresses the following question: is it possible to verify the existence of a multipartite state even when one's measurement devices are...

A Method Level Test Generation Framework for Debugging Big Data Applications

January 24, 2019

Author(s):

Huadong Feng, Jagan Chandrasekaran, Yu Lei, Raghu N. Kacker, David R. Kuhn

When a failure occurs in a big data application, debugging with the original dataset can be difficult due to the large amount of data being processed. This...

Three-Port Vector-Network-Analyzer Calibrations using the NIST Microwave Uncertainty Framework

January 19, 2019

Author(s):

Jeffrey A. Jargon, Dylan F. Williams, Aric W. Sanders

We developed methods for calibrating three-port vector network analyzers (VNAs) and propagating correlated uncertainties using the NIST Microwave Uncertainty...

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